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公开(公告)号:US11060992B2
公开(公告)日:2021-07-13
申请号:US15468868
申请日:2017-03-24
Applicant: Rosemount Aerospace Inc.
Inventor: Ben Ping-Tao Fok , Thomas Wingert
IPC: G01N27/20 , G01R31/00 , H05B3/44 , G01R19/32 , G01N27/24 , G01J5/02 , B64D15/12 , B64D45/00 , G01K15/00 , H05B3/56 , G01K13/02 , G01P13/02 , H05B1/02 , G01P5/165 , G01J5/00
Abstract: A probe system includes a heater and a control circuit. The heater includes a resistive heating element routed through the probe. An operational voltage is provided to the resistive heating element to provide heating for the probe. The control circuit is configured to provide a test voltage different than the operational voltage and monitor a test current generated in the resistive heating element while providing the test voltage. The control circuit is further configured to detect micro fractures in the resistive heating element based on the test current.
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公开(公告)号:US20180275184A1
公开(公告)日:2018-09-27
申请号:US15468882
申请日:2017-03-24
Applicant: Rosemount Aerospace Inc.
Inventor: Magdi A. Essawy , Ben Ping-Tao Fok
CPC classification number: G01R31/008 , G01J5/025 , G01J2005/0077 , G01K13/028 , G01K15/007 , G01N27/026 , G01N27/20 , G01N27/24 , G01P5/165 , G01P13/025 , G01R19/32 , H05B1/0236 , H05B3/44 , H05B3/56 , H05B2214/02
Abstract: A probe system includes a heater and a control circuit. The heater includes a resistive heating element routed through the probe. An operational current is provided to the resistive heating element to provide heating for the probe. The control circuit is configured to monitor the operational current over time and determine a half-life estimate of the resistive heating element based upon an exponential function of the operational current over time.
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公开(公告)号:US20180275080A1
公开(公告)日:2018-09-27
申请号:US15468860
申请日:2017-03-24
Applicant: Rosemount Aerospace Inc.
Inventor: Magdi A. Essawy , Ben Ping-Tao Fok , Marvin Gary Onken
IPC: G01N25/72 , G01R31/00 , H05B3/44 , G01N27/20 , G01N27/24 , G01N27/02 , G01R19/32 , G01J5/02 , B64D15/12 , B64D47/08 , B64D45/00
CPC classification number: G01N25/72 , B64D15/12 , B64D45/00 , B64D47/08 , B64D2045/0085 , G01J5/025 , G01J2005/0077 , G01K13/028 , G01K15/007 , G01N27/026 , G01N27/20 , G01N27/24 , G01P5/165 , G01P13/025 , G01R19/32 , G01R31/008 , H05B1/0236 , H05B3/44 , H05B3/56 , H05B2214/02
Abstract: A probe system is configured to receive thermal images of the probe system from a thermal imager and includes a heater and a control circuit. The heater includes a resistive heating element routed through the probe. An operational voltage is provided to the resistive heating element to provide heating for the probe. The control circuit is configured to provide the operational voltage and receive the thermal images from the thermal imager. The control circuit is further configured to monitor the thermal images over time and determine a remaining useful life of the probe system based upon the thermal images over time.
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公开(公告)号:US10180449B2
公开(公告)日:2019-01-15
申请号:US15468882
申请日:2017-03-24
Applicant: Rosemount Aerospace Inc.
Inventor: Magdi A. Essawy , Ben Ping-Tao Fok
Abstract: A probe system includes a heater and a control circuit. The heater includes a resistive heating element routed through the probe. An operational current is provided to the resistive heating element to provide heating for the probe. The control circuit is configured to monitor the operational current over time and determine a half-life estimate of the resistive heating element based upon an exponential function of the operational current over time.
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公开(公告)号:US20180275085A1
公开(公告)日:2018-09-27
申请号:US15468868
申请日:2017-03-24
Applicant: Rosemount Aerospace Inc.
Inventor: Ben Ping-Tao Fok , Thomas Wingert
CPC classification number: G01N27/20 , B64D15/12 , B64D45/00 , B64D2045/0085 , G01J5/025 , G01J2005/0077 , G01K13/028 , G01K15/007 , G01N27/24 , G01P5/165 , G01P13/025 , G01R19/32 , G01R31/008 , H05B1/0236 , H05B3/44 , H05B3/56 , H05B2214/02
Abstract: A probe system includes a heater and a control circuit. The heater includes a resistive heating element routed through the probe. An operational voltage is provided to the resistive heating element to provide heating for the probe. The control circuit is configured to provide a test voltage different than the operational voltage and monitor a test current generated in the resistive heating element while providing the test voltage. The control circuit is further configured to detect micro fractures in the resistive heating element based on the test current.
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公开(公告)号:US10564203B2
公开(公告)日:2020-02-18
申请号:US15468829
申请日:2017-03-24
Applicant: Rosemount Aerospace Inc.
Inventor: Magdi A. Essawy , Ben Ping-Tao Fok
IPC: G01R31/00 , G01K13/02 , G01P13/02 , G01K15/00 , G01P21/02 , G01P5/165 , H05B3/56 , H05B3/48 , B64D15/12 , B64D47/02 , G01J5/02 , G01N27/02 , G01N27/20 , G01N27/24 , G01R19/32 , H05B3/44 , G01J5/00
Abstract: A probe system includes a heater and a control circuit. The heater includes a resistive heating element routed through the probe system. An operational voltage is provided to the resistive heating element to provide heating for the probe system. The control circuit is configured to provide the operational voltage and monitor a capacitance between the resistive heating element and a metallic sheath of the heater over time. The control circuit is further configured to determine a remaining useful life of the probe system based on the capacitance.
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公开(公告)号:US10197517B2
公开(公告)日:2019-02-05
申请号:US15468860
申请日:2017-03-24
Applicant: Rosemount Aerospace Inc.
Inventor: Magdi A. Essawy , Ben Ping-Tao Fok , Marvin Gary Onken
IPC: G01N25/72 , G01P5/165 , G01P13/02 , G01K13/02 , G01K15/00 , G01R31/00 , H05B3/56 , B64D15/12 , B64D45/00 , B64D47/08 , G01J5/02 , G01N27/02 , G01N27/20 , G01N27/24 , G01R19/32 , H05B3/44 , G01J5/00
Abstract: A probe system is configured to receive thermal images of the probe system from a thermal imager and includes a heater and a control circuit. The heater includes a resistive heating element routed through the probe. An operational voltage is provided to the resistive heating element to provide heating for the probe. The control circuit is configured to provide the operational voltage and receive the thermal images from the thermal imager. The control circuit is further configured to monitor the thermal images over time and determine a remaining useful life of the probe system based upon the thermal images over time.
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公开(公告)号:US20180275181A1
公开(公告)日:2018-09-27
申请号:US15468829
申请日:2017-03-24
Applicant: Rosemount Aerospace Inc.
Inventor: Magdi A. Essawy , Ben Ping-Tao Fok
IPC: G01R31/00 , H05B3/44 , G01N27/24 , G01R19/32 , G01N27/02 , G01N27/20 , G01J5/02 , B64D15/12 , B64D47/02
Abstract: A probe system includes a heater and a control circuit. The heater includes a resistive heating element routed through the probe system. An operational voltage is provided to the resistive heating element to provide heating for the probe system. The control circuit is configured to provide the operational voltage and monitor a capacitance between the resistive heating element and a metallic sheath of the heater over time. The control circuit is further configured to determine a remaining useful life of the probe system based on the capacitance.
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公开(公告)号:US10914777B2
公开(公告)日:2021-02-09
申请号:US15623617
申请日:2017-06-15
Applicant: Rosemount Aerospace Inc.
Inventor: Magdi A. Essawy , Ben Ping-Tao Fok , Thomas Wingert
IPC: G01R31/00 , G01R31/02 , G01R19/32 , G01R1/30 , B64D43/02 , B64D15/12 , B64D45/00 , H05B3/00 , G01R31/50
Abstract: A system and method for an aircraft includes a probe, first and second current sensors, and a control circuit. The probe includes a heater that includes a resistive heating element routed through the probe, wherein an operational current is provided to the resistive heating element to provide heating for the probe. The first current sensor is configured to sense a first current through the resistive heating element, and the second current sensor is configured to sense a second current through the resistive heating element. The control circuit is configured to determine a leakage current based on the first and second currents and determine a remaining useful life the probe based on the leakage current over time.
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公开(公告)号:US20200373109A1
公开(公告)日:2020-11-26
申请号:US16418332
申请日:2019-05-21
Applicant: Rosemount Aerospace, Inc.
Inventor: David P. Potasek , Ben Ping-Tao Fok , Roger Alan Backman
Abstract: Disclosed is a thin-film micro-fuse assembly having: a substrate; an insulating layer disposed on the substrate, the insulating layer comprising silicon dioxide; a conductor disposed on the insulating layer, the conductor forming: an inlet terminal, an outlet terminal and a fuse element between the inlet terminal and the outlet terminal, the inlet terminal and the outlet terminal widthwise converging toward the fuse element, and the fuse element having a first thickness and a first width that is between 1 and 5 times the first thickness.
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