公开(公告)号：US20170248480A1

公开(公告)日：2017-08-31

申请号：US15597539

申请日：2017-05-17

Applicant: SENTEK INSTRTUMENT LLC

Inventor： Bo Dong ,  Fabin Shen ,  Anbo Wang

IPC: G01L1/24 ,  E21B47/12 ,  G01D18/00 ,  G01D5/353

CPC classification number: G01L1/246 ,  E21B47/123 ,  G01D5/35312 ,  G01D5/35316 ,  G01D18/00

Abstract: A serial weak FBG interrogator is disclosed. The serial weak FBG interrogator may include a CW tunable laser or pulsed laser utilized as a laser source and an EDFA. The serial weak FBG interrogator may also be an interrogation of a single sensor system by utilization of a DFB laser which utilizes a single sensor, which may be an interferometer sensor, an extrinsic Fabry-Perot interferometer or a wavelength-modulated sensor. The serial weak FBG interrogator may also include a computer system or CSPU.

公开(公告)号：US10234346B2

公开(公告)日：2019-03-19

申请号：US15597539

申请日：2017-05-17

Applicant: SENTEK INSTRTUMENT LLC

Inventor： Bo Dong ,  Fabin Shen ,  Anbo Wang

IPC: G01L1/24 ,  G01D5/353 ,  G01D18/00 ,  E21B47/12

Abstract: A serial weak FBG interrogator is disclosed. The serial weak FBG interrogator may include a CW tunable laser or pulsed laser utilized as a laser source and an EDFA. The serial weak FBG interrogator may also be an interrogation of a single sensor system by utilization of a DFB laser which utilizes a single sensor, which may be an interferometer sensor, an extrinsic Fabry-Perot interferometer or a wavelength-modulated sensor. The serial weak FBG interrogator may also include a computer system or CSPU.