公开(公告)号：US20220082724A1

公开(公告)日：2022-03-17

申请号：US17415940

申请日：2018-12-20

Applicant: SICK AG ,  TRUMPF Werkzeugmaschinen GmbH + Co. KG

Inventor： Jens OTTNAD ,  Dennis WOLF ,  Kevin LUTZ ,  Christoph BLÖMKER ,  Michael BURGER ,  Peter STEURER ,  Günter HIRT ,  Stefan KIENZLER

IPC: G01V8/20 ,  B23Q15/007

Abstract: A sensor apparatus for detecting a target object influenced by a process or formed in the process includes a sensor unit and an evaluation device. The sensor unit detects the target object in a detection zone of the sensor unit and generates a sensor signal that can be influenced by the target object. The evaluation device processes the sensor signal as a first input variable and generates an output signal, which indicates the detection of the target object, in dependence on the sensor signal. The evaluation device further processes a process parameter of the process, which acts on the target object, or a target object parameter, which characterizes the target object and is influenced by the process, as a respective further input variable and to generate the output signal in dependence on the process parameter and/or the target object parameter.

公开(公告)号：US20170372251A1

公开(公告)日：2017-12-28

申请号：US15631209

申请日：2017-06-23

Applicant: SICK AG

Inventor： Gerhard ALT ,  Patrick BORNSTEIN ,  Davorin JAKSIC ,  Daniel KIETZ ,  Christoph MÄRKLE ,  Michael BURGER ,  Armin VOGELBACHER ,  Michael STINGL ,  Simone SCHWARZ

IPC: G06Q10/06

Abstract: The invention relates to a system for simulating sensors that in particular measure a distance between the sensor and an object, that measure geometrical dimensions of the object, that measure positions of the object, that measure material, contrast, color, luminescence, brightness or transparency of the object, that measure polarization of the light reflected by the object or that measure a magnetic field strength.