公开(公告)号：US10546373B2

公开(公告)日：2020-01-28

申请号：US15668242

申请日：2017-08-03

Applicant: SIGHTLINE INNOVATION INC.

Inventor： Wallace Trenholm ,  Maithili Mavinkurve ,  Jason Cassidy

IPC: G06T7/00 ,  G01B11/30 ,  G06T7/41 ,  G06T5/00 ,  G06K9/66 ,  H04N5/225 ,  G06T7/70 ,  G06N3/04 ,  G06N3/08 ,  G01N21/00

Abstract: There is provided systems and methods for laser scanning of one or more surfaces; in a particular embodiment, laser scanning of concrete. The system includes: at least one laser scanning module for acquiring imaging data comprising one or more distance measurements between the laser scanning module and each of the surfaces, according to a laser scanning modality; and a computing module, including one or more processors, in communication with the laser scanning module, for: aggregating the imaging data; processing and denoising the imaging data; and determining the presence or absence of a condition on each of the surfaces based on the imaging data.

公开(公告)号：US10977814B2

公开(公告)日：2021-04-13

申请号：US16239637

申请日：2019-01-04

Applicant: SIGHTLINE INNOVATION INC.

Inventor： Wallace Trenholm ,  Maithili Mavinkurve ,  Mark Alexiuk ,  Jason Cassidy

IPC: G06K9/20 ,  G06K9/62 ,  G06T7/514 ,  G06T7/00 ,  G01B11/25 ,  G06T5/00 ,  G06T5/50 ,  H04N5/369 ,  H04N5/372

Abstract: Embodiments described herein relate to systems and methods for specular surface inspection, and particularly to systems and methods for surface inspection comprising inverse synthetic aperture imaging (“ISAI”) and specular surface geometry imaging (“SSGI”). Embodiments may allow an object under inspection, to be observed, imaged and processed while continuing to be in motion. Further, multiple optical input sources may be provided, such that the object does not have to be in full view of all optical sensors at once. Further, multi-stage surface inspection may be provided, wherein an object under inspection may be inspected at multiple stages of an inspection system, such as, for an automotive painting process, inspection at primer, inspection at paint, inspection at final assembly. SSGI imaging modules are also described for carrying out micro-deflectometry.

公开(公告)号：US10176588B2

公开(公告)日：2019-01-08

申请号：US15265161

申请日：2016-09-14

Applicant: SIGHTLINE INNOVATION INC.

Inventor： Wallace Trenholm ,  Maithili Mavinkurve ,  Mark Alexiuk ,  Jason Cassidy

IPC: G06K9/60 ,  G06T7/514 ,  G06T5/00 ,  G06T5/50 ,  G06T7/00 ,  H04N5/369 ,  H04N5/372

Abstract: Embodiments described herein relate to systems and methods for specular surface inspection, and particularly to systems and methods for surface inspection comprising inverse synthetic aperture imaging (“ISAI”) and specular surface geometry imaging (“SSGI”). Embodiments may allow an object under inspection, to be observed, imaged and processed while continuing to be in motion. Further, multiple optical input sources may be provided, such that the object does not have to be in full view of all optical sensors at once. Further, multi-stage surface inspection may be provided, wherein an object under inspection may be inspected at multiple stages of an inspection system, such as, for an automotive painting process, inspection at primer, inspection at paint, inspection at final assembly. SSGI imaging modules are also described for carrying out micro-deflectometry.