公开(公告)号：US20170030824A1

公开(公告)日：2017-02-02

申请号：US15231146

申请日：2016-08-08

Applicant: SONY CORPORATION

Inventor： TAICHI TAKEUCHI ,  SHINGO IMANISHI

IPC: G01N15/14 ,  G01N21/21 ,  G01N21/64 ,  G01N21/53

CPC classification number: G01N15/1436 ,  G01N15/1429 ,  G01N15/1434 ,  G01N15/1459 ,  G01N21/21 ,  G01N21/47 ,  G01N21/49 ,  G01N21/53 ,  G01N21/645 ,  G01N2015/0065 ,  G01N2015/1006 ,  G01N2021/6478 ,  G01N2201/06113 ,  G01N2201/0638 ,  G01N2201/0683

Abstract: A microparticle measuring apparatus for highly accurately detecting the position of a microparticle flowing through a flow channel includes a light irradiation unit for irradiating a microparticle flowing through a flow channel with light, and a scattered light detection unit for detecting scattered light from the microparticle, including an objective lens for collecting light from the microparticle, a light splitting element for dividing the scattered light from the light collected by the objective lens, into first and second scattered light, a first scattered light detector for receiving an S-polarized light component, and an astigmatic element disposed between the light splitting element and the first scattered light detector, and making the first scattered light astigmatic. A relationship between a length L from a rear principal point of the objective lens to a front principal point of the astigmatic element, and a focal length f of the astigmatic element satisfies the following formula I. 1.5f≦L≦2.5f  (I)

Abstract translation: 用于高精度地检测流过流路的微粒的位置的微粒测量装置包括：用于照射流过流路的微粒的光照射单元，以及用于检测来自微粒的散射光的散射光检测单元，包括 用于收集来自微粒的光的物镜，将从物镜收集的光中散射的光分成第一和第二散射光的分光元件，用于接收S偏振光分量的第一散射光检测器，以及 设置在所述分光元件和所述第一散射光检测器之间的散光元件，以及使所述第一散射光散光。 从物镜的后方主点到散光元件的前主点的长度L与散光元件的焦距f之间的关系满足以下公式I. 1.5 ¢‰¤L‰2.5 ¢f