-
公开(公告)号:US20200219832A1
公开(公告)日:2020-07-09
申请号:US16826216
申请日:2020-03-21
Applicant: STATS ChipPAC Pte. Ltd.
Inventor: Pandi Chelvam Marimuthu , Andy Chang Bum Yong , Aung Kyaw Oo , Yaojian Lin
IPC: H01L23/66 , H01L21/48 , H01L23/498 , H01L21/56 , H01L23/522 , H01L23/528 , H01L23/00 , H01L23/538 , H01L23/552 , H01L21/683
Abstract: A semiconductor device has a semiconductor die and an encapsulant deposited over the semiconductor die. A first conductive layer is formed with an antenna over a first surface of the encapsulant. A second conductive layer is formed with a ground plane over a second surface of the encapsulant with the antenna located within a footprint of the ground plane. A conductive bump is formed on the ground plane. A third conductive layer is formed over the first surface of the encapsulant. A fourth conductive layer is formed over the second surface of the encapsulant. A conductive via is disposed adjacent to the semiconductor die prior to depositing the encapsulant. The antenna is coupled to the semiconductor die through the conductive via. The antenna is formed with the conductive via between the antenna and semiconductor die. A PCB unit is disposed in the encapsulant.
-
公开(公告)号:US10510632B2
公开(公告)日:2019-12-17
申请号:US15919401
申请日:2018-03-13
Applicant: STATS ChipPAC Pte. Ltd.
Inventor: Won Kyoung Choi , Pandi Chelvam Marimuthu
IPC: H01L21/44 , H01L21/48 , H01L21/50 , H01L23/31 , H01L23/538 , H01L21/768 , H01L25/00 , H01L21/56
Abstract: A semiconductor device has a carrier and a semiconductor die disposed over the carrier. A dummy die is disposed over the carrier as well. A first encapsulant is deposited over the semiconductor die and dummy die. The dummy die and a first portion of the first encapsulant is backgrinded while a second portion of the first encapsulant remains covering the semiconductor die. Backgrinding the dummy die fully removes the dummy die while the second portion of the first encapsulant remains covering the semiconductor die. A second encapsulant is optionally deposited over the dummy die prior to disposing the dummy die over the carrier. A conductive pillar is optionally formed over the dummy die prior to depositing the second encapsulant. The carrier is removed to expose an active surface of the semiconductor die. A build-up interconnect structure is formed over the active surface after removing the carrier.
-
公开(公告)号:US20190287873A1
公开(公告)日:2019-09-19
申请号:US15919401
申请日:2018-03-13
Applicant: STATS ChipPAC Pte. Ltd.
Inventor: Won Kyoung Choi , Pandi Chelvam Marimuthu
IPC: H01L23/31 , H01L23/538 , H01L21/56 , H01L25/00 , H01L21/768
Abstract: A semiconductor device has a carrier and a semiconductor die disposed over the carrier. A dummy die is disposed over the carrier as well. A first encapsulant is deposited over the semiconductor die and dummy die. The dummy die and a first portion of the first encapsulant is backgrinded while a second portion of the first encapsulant remains covering the semiconductor die. Backgrinding the dummy die fully removes the dummy die while the second portion of the first encapsulant remains covering the semiconductor die. A second encapsulant is optionally deposited over the dummy die prior to disposing the dummy die over the carrier. A conductive pillar is optionally formed over the dummy die prior to depositing the second encapsulant. The carrier is removed to expose an active surface of the semiconductor die. A build-up interconnect structure is formed over the active surface after removing the carrier.
-
公开(公告)号:US20220375886A1
公开(公告)日:2022-11-24
申请号:US17817481
申请日:2022-08-04
Applicant: STATS ChipPAC Pte. Ltd.
Inventor: Pandi Chelvam Marimuthu , Andy Chang Bum Yong , Aung Kyaw Oo , Yaojian Lin
IPC: H01L23/66 , H01L21/48 , H01L23/498 , H01L21/56 , H01L23/522 , H01L23/528 , H01L23/00 , H01L23/538 , H01L23/552 , H01L21/683
Abstract: A semiconductor device has a semiconductor die and an encapsulant deposited over the semiconductor die. A first conductive layer is formed with an antenna over a first surface of the encapsulant. A second conductive layer is formed with a ground plane over a second surface of the encapsulant with the antenna located within a footprint of the ground plane. A conductive bump is formed on the ground plane. A third conductive layer is formed over the first surface of the encapsulant. A fourth conductive layer is formed over the second surface of the encapsulant. A conductive via is disposed adjacent to the semiconductor die prior to depositing the encapsulant. The antenna is coupled to the semiconductor die through the conductive via. The antenna is formed with the conductive via between the antenna and semiconductor die. A PCB unit is disposed in the encapsulant.
-
公开(公告)号:US11469191B2
公开(公告)日:2022-10-11
申请号:US16826216
申请日:2020-03-21
Applicant: STATS ChipPAC Pte. Ltd.
Inventor: Pandi Chelvam Marimuthu , Andy Chang Bum Yong , Aung Kyaw Oo , Yaojian Lin
IPC: H01L23/66 , H01L21/48 , H01L23/498 , H01L21/56 , H01L23/522 , H01L23/528 , H01L23/00 , H01L23/538 , H01L23/552 , H01L21/683 , H01L23/31
Abstract: A semiconductor device has a semiconductor die and an encapsulant deposited over the semiconductor die. A first conductive layer is formed with an antenna over a first surface of the encapsulant. A second conductive layer is formed with a ground plane over a second surface of the encapsulant with the antenna located within a footprint of the ground plane. A conductive bump is formed on the ground plane. A third conductive layer is formed over the first surface of the encapsulant. A fourth conductive layer is formed over the second surface of the encapsulant. A conductive via is disposed adjacent to the semiconductor die prior to depositing the encapsulant. The antenna is coupled to the semiconductor die through the conductive via. The antenna is formed with the conductive via between the antenna and semiconductor die. A PCB unit is disposed in the encapsulant.
-
公开(公告)号:US12094843B2
公开(公告)日:2024-09-17
申请号:US17817481
申请日:2022-08-04
Applicant: STATS ChipPAC Pte. Ltd.
Inventor: Pandi Chelvam Marimuthu , Andy Chang Bum Yong , Aung Kyaw Oo , Yaojian Lin
IPC: H01L23/66 , H01L21/48 , H01L21/56 , H01L21/683 , H01L23/00 , H01L23/31 , H01L23/498 , H01L23/522 , H01L23/528 , H01L23/538 , H01L23/552
CPC classification number: H01L23/66 , H01L21/486 , H01L21/568 , H01L21/6835 , H01L23/49816 , H01L23/49827 , H01L23/49838 , H01L23/5225 , H01L23/528 , H01L23/5389 , H01L23/552 , H01L24/19 , H01L24/20 , H01L24/96 , H01L24/97 , H01L23/3128 , H01L23/49833 , H01L2221/68331 , H01L2221/68345 , H01L2221/68354 , H01L2221/68359 , H01L2223/6677 , H01L2224/04105 , H01L2224/12105 , H01L2224/19 , H01L2224/24227 , H01L2224/32225 , H01L2224/73267 , H01L2224/83 , H01L2224/83005 , H01L2224/92244 , H01L2224/94 , H01L2224/97 , H01L2924/15311 , H01L2924/3025 , H01L2924/3511
Abstract: A semiconductor device has a semiconductor die and an encapsulant deposited over the semiconductor die. A first conductive layer is formed with an antenna over a first surface of the encapsulant. A second conductive layer is formed with a ground plane over a second surface of the encapsulant with the antenna located within a footprint of the ground plane. A conductive bump is formed on the ground plane. A third conductive layer is formed over the first surface of the encapsulant. A fourth conductive layer is formed over the second surface of the encapsulant. A conductive via is disposed adjacent to the semiconductor die prior to depositing the encapsulant. The antenna is coupled to the semiconductor die through the conductive via. The antenna is formed with the conductive via between the antenna and semiconductor die. A PCB unit is disposed in the encapsulant.
-
公开(公告)号:US20190088603A1
公开(公告)日:2019-03-21
申请号:US16184134
申请日:2018-11-08
Applicant: STATS ChipPAC Pte. Ltd.
Inventor: Pandi Chelvam Marimuthu , Andy Chang Bum Yong , Aung Kyaw Oo , Yaojian Lin
IPC: H01L23/66 , H01L23/00 , H01L23/498 , H01L21/56 , H01L23/522 , H01L23/552 , H01L23/538 , H01L21/48 , H01L23/528
Abstract: A semiconductor device has a semiconductor die and an encapsulant deposited over the semiconductor die. A first conductive layer is formed with an antenna over a first surface of the encapsulant. A second conductive layer is formed with a ground plane over a second surface of the encapsulant with the antenna located within a footprint of the ground plane. A conductive bump is formed on the ground plane. A third conductive layer is formed over the first surface of the encapsulant. A fourth conductive layer is formed over the second surface of the encapsulant. A conductive via is disposed adjacent to the semiconductor die prior to depositing the encapsulant. The antenna is coupled to the semiconductor die through the conductive via. The antenna is formed with the conductive via between the antenna and semiconductor die. A PCB unit is disposed in the encapsulant.
-
-
-
-
-
-