公开(公告)号：US20200034949A1

公开(公告)日：2020-01-30

申请号：US16335702

申请日：2017-09-21

Applicant: STELLENBOSCH UNIVERSITY

Inventor： Adriaan van Niekerk ,  Dugal Jeremy Harris

IPC: G06T3/40 ,  G06T7/73

Abstract: A system and method for generating radiometrically corrected surface images is provided. This includes providing one or more surface images of a first resolution of a surface area in the form of digital images which has a surface image sensor measurement of an intensity value of radiation in a given wavelength band reflected from the surface for each pixel of the images. A reference image of a second resolution of a corresponding surface area is provided to the surface of the surface image. The reference image has a surface reflectance for each pixel of the reference image for an equivalent wavelength band to the given wavelength band of the surface image. A functional relationship is modelled which relates the surface image sensor measurement for pixels of a surface image to the surface reflectance for pixels of the reference image to provide an estimated surface reflectance for each pixel of the surface images.