METHOD OF MANUFACTURING A BIPOLAR TRANSISTOR

    公开(公告)号:US20250120106A1

    公开(公告)日:2025-04-10

    申请号:US18905487

    申请日:2024-10-03

    Abstract: A method of making a bipolar transistor includes: forming a first collector part of a first conductivity type in a semiconductor layer; forming a first insulating region made of a first insulating material on the first collector part; forming a conduction layer intended to form a first doped base part of the second conductivity type on the first insulating region; forming an opening having a first width in the conduction layer that emerges onto the first insulating region; forming an insulating layer on the conduction layer and in the opening; forming a cavity in the insulating layer and in the first insulating region that emerges onto a portion of the first collector part through the opening, the cavity having at the level of the opening a second width smaller than the first width; and forming a second collector part in the cavity on the portion of the first collector part.

    BIPOLAR TRANSISTOR
    2.
    发明申请

    公开(公告)号:US20240404940A1

    公开(公告)日:2024-12-05

    申请号:US18678025

    申请日:2024-05-30

    Inventor: Pascal CHEVALIER

    Abstract: A device includes a bipolar transistor. The bipolar transistor includes: a collector region, a base region, and an emitter region. A first metallization is in contact with the emitter region, a second metallization is in contact with the base region, and a third metallization is in contact with the collector region. A first connection element is coupled to the first metallization and has dimensions, in a plane of the interface between the first metallization and the connection element, greater than dimensions of the first metallization. A second connection element is coupled to the second metallization and passes through spacers, which at least partially cover the second metallization, surrounding the emitter region. A third connection element is coupled to the third metallization and passes through spacers, which at least partially cover the third metallization, surrounding the base region.

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