公开(公告)号：US12228491B2

公开(公告)日：2025-02-18

申请号：US16585302

申请日：2019-09-27

Applicant: SYSMEX CORPORATION

Inventor： Hiroo Tatsutani ,  Motoi Kinishi ,  Tomohiro Tsuji ,  Yasuaki Tsuruoka ,  Satoshi Yoneda

IPC: G01N15/10 ,  G01N15/14 ,  G01N15/1429

Abstract: Disclosed is a measurement apparatus that includes: a measurement unit configured to measure a control sample for quality control; a display unit; and a processing unit configured to cause the display unit to display an input screen for setting an evaluation criterion used in the quality control, and, in the measurement apparatus, the processing unit causes the display unit to display a quality control result of a test item, based on the evaluation criterion and a measurement result of the control sample.