公开(公告)号：US20080010523A1

公开(公告)日：2008-01-10

申请号：US11383106

申请日：2006-05-12

Applicant: Samik Mukherjee

Inventor： Samik Mukherjee

IPC: G06F11/00

CPC classification number: G06F11/3414 ,  G06F11/3433 ,  G06F2201/87 ,  H04L43/12 ,  H04L43/50 ,  H04L63/164

Abstract: There is disclosed apparatus and methods for testing performance of a system under test. The test is performance according to a standard. The system under test does not conform to the standard, but the non-conformance may be irrelevant to the test. There may be provided set up parameters and daemons which cover over the non-conformance, allowing the test to proceed.

Abstract translation: 公开了用于测试被测系统的性能的装置和方法。 测试是根据标准执行的。 被测系统不符合标准，但不合格可能与测试无关。 可能会提供设置参数和守护进程，覆盖不符合项，允许测试进行。