公开(公告)号：US20250061558A1

公开(公告)日：2025-02-20

申请号：US18805724

申请日：2024-08-15

Applicant: Samsung Electronics Co., Ltd.

Inventor： Yubin LEE ,  Dayun LEE ,  Kundong KIM ,  Yongkoo PARK

IPC: G06T7/00 ,  G06V10/764 ,  G06V10/82

Abstract: A system for testing whether or not an image sensor included in an image frame is defective includes including a processor configured to execute machine-readable instructions that, when executed by the processor, cause the test device to generate a test image by performing one or more preprocessing operations on a raw image output from an image sensor, and to classify an image pattern of the test image as any one of patterns included in a first data set by using a first deep learning neural network trained based on the first data set and to determine, based on a classifying result, whether or not the image sensor is defective. The first data set comprises a data set for each pattern, classified to correspond to each of one or more defect patterns and to a normal pattern of an image.