公开(公告)号：US20190179487A1

公开(公告)日：2019-06-13

申请号：US16322021

申请日：2017-06-26

Applicant: Samsung Electronics Co., Ltd.

Inventor： Kyucheol KONG ,  Hyesoon JEONG ,  Dae-Sik HWANG ,  Songgeun KIM ,  Jeong-Jin LEE ,  Hoondo HEO ,  Hyun-Suk CHOI

IPC: G06F3/041 ,  G06F3/0488

Abstract: Various embodiments of the present invention provide a method and apparatus for preventing a user's unintentional touch input in an electronic device. According to various embodiments of the present invention, an electronic device may comprise: a display for displaying a user interface; a memory; and a processor functionally connected to the display and the memory, wherein the processor is configured to set a touch blocking area in the edge area of the display, determine an exception area in the touch blocking area on the basis of the user interface, remove the determined exception area from the touch blocking area, so as to set a final touch blocking area, and process a touch event on the edge area on the basis of the final touch blocking area. Various embodiments are possible.

公开(公告)号：US20150294455A1

公开(公告)日：2015-10-15

申请号：US14581232

申请日：2014-12-23

Applicant: Samsung Electronics Co., Ltd.

Inventor： Jeong-Jin LEE ,  Seung-Hwa OH ,  Chan HWANG

IPC: G06T7/00 ,  G06T1/00 ,  G06K9/46 ,  H01L23/544 ,  G01N21/88

CPC classification number: G06K9/46 ,  G01N21/9501 ,  G01N21/95607 ,  G01N2021/8854 ,  G01N2021/8877 ,  G01N2021/8887 ,  G03F7/7065 ,  G06T7/0006 ,  G06T2207/30148 ,  H01L22/12 ,  H01L22/20 ,  H01L23/544 ,  H01L2924/0002 ,  H01L2924/00

Abstract: Provided are methods of testing pattern reliability and methods of testing a semiconductor device using the same. A method of testing pattern reliability may include acquiring an optical image of a wafer on which a plurality of patterns are formed, evaluating degrees of damage of ones of the plurality of patterns based on the optical image, determining a respective reliability of the ones of the plurality of patterns according to the evaluated respective degrees of damage, and mapping the reliability of the ones of the plurality of patterns based on locations of the respective patterns on the wafer.

Abstract translation: 提供了测试图案可靠性的方法以及使用其测试半导体器件的方法。 测试图案可靠性的方法可以包括获取其上形成有多个图案的晶片的光学图像，基于光学图像评估多个图案中的一个的损伤程度，确定其中的一个的可靠性 根据评估的相应损伤程度的多个图案，并且基于晶片上的各个图案的位置来映射多个图案中的图案的可靠性。

公开(公告)号：US20170357365A1

公开(公告)日：2017-12-14

申请号：US15606105

申请日：2017-05-26

Applicant: Samsung Electronics Co., Ltd.

Inventor： Youngho CHO ,  Jeong-Jin LEE ,  Iljoo CHAE ,  Chang-Hee HONG ,  Moo-Young KIM

IPC: G06F3/041

CPC classification number: G06F3/0416 ,  G06F3/0414 ,  G06F3/044 ,  G06F2203/04104 ,  G06F2203/04105 ,  G06F2203/04106

Abstract: An apparatus and method for processing a user input in an electronic device are provided. The electronic device includes a touch device detecting a touch input; a pressure device detecting a pressure input; and at least one processor. The at least one processor is configured to if the pressure input is detected, generate an event corresponding to the pressure input, determine if the touch input is detected while the pressure input is detected, if the touch input is detected while the pressure input is detected, update the event to correspond to the pressure input and the touch input, and process the updated event.