公开(公告)号：US20170337988A1

公开(公告)日：2017-11-23

申请号：US15456195

申请日：2017-03-10

Applicant: Samsung Electronics Co., Ltd.

Inventor： Joosung Yun ,  Seongseob SHIN ,  Moon-Ho LEE ,  Woonsup CHOI

IPC: G11C29/56

CPC classification number: G11C29/56016 ,  G01R31/2851 ,  G11C29/48 ,  G11C29/56012 ,  G11C2029/5602 ,  H04B2001/305

Abstract: A test apparatus includes a device under test (DUT) configured to exchange data using a serial interface protocol and a test controller configured to receive a binary vector corresponding to a physical layer of the serial interface protocol from an external device and to buffer and transmit the received binary vector to the DUT.