Apparatus for hard baking photoresist pattern

    公开(公告)号:US06483068B2

    公开(公告)日:2002-11-19

    申请号:US09767260

    申请日:2001-01-23

    Applicant: Se-Jin Jang

    Inventor: Se-Jin Jang

    CPC classification number: H01L21/67115

    Abstract: A hard baking apparatus which is capable of evenly heating a semiconductor substrate when a photoresist pattern of the semiconductor substrate is hard baked. The apparatus for hard baking a photoresist pattern including: a chamber; a chuck installed at a lower portion in the chamber on which a semiconductor substrate is mounted; a heating unit installed at an upper portion in the chamber; and a unit installed at a lower portion of the heating unit for evenly distributing light.

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