公开(公告)号：US20220417390A1

公开(公告)日：2022-12-29

申请号：US17764622

申请日：2020-09-29

Applicant: Semiconductor Energy Laboratory Co., Ltd.

Inventor： Kengo AKIMOTO ,  Seiko INOUE ,  Daichi MISHIMA

IPC: H04N1/60

Abstract: Color filters are used for color images obtained using imaging devices such as conventional image sensors. Imaging elements with color filters are sold, and an appropriate combination of the imaging element and a lens or the like is incorporated in an electronic device. Only providing a color filter to overlap a light-receiving region of an image sensor reduces the amount of light reaching the light-receiving region. An imaging system of the present invention includes a solid-state imaging element without a color filter, a storage device, and a learning device. Since the color filter is not included, colorization is performed on obtained monochrome image data (analog data), and coloring is performed using an AI system.

公开(公告)号：US20220417484A1

公开(公告)日：2022-12-29

申请号：US17779717

申请日：2020-12-14

Applicant: Semiconductor Energy Laboratory Co., Ltd.

Inventor： Kengo AKIMOTO ,  Seiko INOUE ,  Daichi MISHIMA

IPC: H04N9/43 ,  H04N5/374 ,  H04N9/67 ,  H04N7/18 ,  G06T7/90

Abstract: Color filters are used for color images obtained using imaging devices such as conventional image sensors. Imaging elements with color filters are sold, and an appropriate combination of the imaging element and a lens or the like is incorporated in an electronic device. Only providing a color filter to overlap a light-receiving region of an image sensor reduces the amount of light reaching the light-receiving region.
An imaging system of the present invention includes a solid-state imaging element without a color filter, a storage device, and a learning device. As a selection standard for reducing the amount of learning data, in an HSV color space, saturation is used, and selection is performed so that the saturation has optimal distribution. When colorization disclosed in this specification is performed, the colorization and object highlight processing can be performed at the same time.

公开(公告)号：US20230067287A1

公开(公告)日：2023-03-02

申请号：US17794698

申请日：2021-01-27

Applicant: Semiconductor Energy Laboratory Co., Ltd.

Inventor： Kengo AKIMOTO ,  Daichi MISHIMA

IPC: G06T5/00

Abstract: An image processing system that can reduce display unevenness in an image displayed on a display device is provided. The image processing system includes a display device, an image capturing device, and a learning device. The learning device stores a table representing information on the correspondence between first image data and second image data that is generated by display of an image corresponding to the first image data on the display device and image capturing of the image by the image capturing device. The learning device generates teacher data in accordance with the table and generates a machine learning model with the use of the teacher data generated. Image processing using the machine learning model is performed on image data input to the display device, so that display unevenness in the image displayed on the display device can be reduced.

公开(公告)号：US20220365587A1

公开(公告)日：2022-11-17

申请号：US17629866

申请日：2020-07-17

Applicant: Semiconductor Energy Laboratory Co., Ltd.

Inventor： Shunpei Yamazaki ,  Koki INOUE ,  Ryo NAKAZATO ,  Daichi MISHIMA

IPC: G06F1/3296 ,  G06F1/04

Abstract: A data processing system having high reliability and an operation method thereof are provided. The data processing system includes an arithmetic processing device including a nonvolatile memory and/or a nonvolatile register, and a monitoring system for monitoring an operation state of the arithmetic processing device. The monitoring system is a system utilizing artificial intelligence, and has a function of estimating from a program operating on the arithmetic processing device how much and which location of the arithmetic processing device will increase in temperature when the program operates. When the monitoring system estimates that the temperature of part of the arithmetic processing device will exceed a threshold value when the program operates, the monitoring system transmits an instruction to lower a clock frequency of the part of the arithmetic processing device, reduce a power supply potential of the part, or interrupt power supply to the part.