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公开(公告)号：US20210138578A1
公开(公告)日：2021-05-13
申请号：US17091644
申请日：2020-11-06
Applicant: SIGMA LABS, INC.
Inventor： Darren Beckett , Martin S. Piltch , Scott Betts , Alberto M. Castro , Kevin Anderson , Lars Jacquemetton , Luis Aguilar
Abstract: An additive manufacturing system comprises a build plane and an energy source configured to direct energy onto a work region of the build plane. An optical detector is configured to receive one or more optical signals from the work region. An optical filter is positioned between the work region and the optical detector, wherein the optical filter includes a first partially transmissive polarized filter having a first polarization axis and a second partially transmissive polarized filter having a second polarization axis. The first polarization axis is rotationally offset from the second polarization axis approximately 90 degrees. The optical filter improves the signal to noise ratio of the optical sensors.
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2.发明申请公开(公告)号：US20190255654A1
公开(公告)日：2019-08-22
申请号：US16282004
申请日：2019-02-21
Applicant: Sigma Labs, Inc.
Inventor： Darren Beckett , Scott Betts , Martin Piltch , R. Bruce Madigan , Lars Jacquemetton , Glenn Wikle , Mark J. Cola , Vivek R. Dave , Alberto M. Castro , Roger Frye
IPC: B23K26/34 , B33Y10/00 , B33Y50/02 , B23K15/00 , B23K26/354
Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensing system that monitors two discrete wavelengths associated with a blackbody radiation curve of the layer of powder; determining temperature variations for an area of the build plane traversed by the scans based upon a ratio of sensor readings taken at the two discrete wavelengths; determining that the temperature variations are outside a threshold range of values; and thereafter, adjusting subsequent scans of the energy source across or proximate the area of the build plane.
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3.发明授权公开(公告)号：US11938560B2
公开(公告)日：2024-03-26
申请号：US17839853
申请日：2022-06-14
Applicant: Sigma Labs, Inc.
Inventor： R. Bruce Madigan , Lars Jacquemetton , Glenn Wikle , Mark J. Cola , Vivek R. Dave , Darren Beckett , Alberto M. Castro
IPC: B23K26/03 , B22F12/90 , B23K15/00 , B23K26/342 , B23K26/70 , B23K31/12 , B29C64/393 , B33Y10/00 , B33Y50/00 , B33Y50/02 , B22F10/28 , B22F10/31 , B23K101/00
CPC classification number: B23K26/032 , B22F12/90 , B23K15/0086 , B23K26/342 , B23K26/70 , B23K31/125 , B29C64/393 , B33Y10/00 , B33Y50/00 , B33Y50/02 , B22F10/28 , B22F10/31 , B22F2203/11 , B23K2101/001
Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensor; determining an area of the build plane traversed during the scans; determining a thermal energy density for the area of the build plane traversed by the scans based upon the amount of energy radiated and the area of the build plane traversed by the scans; mapping the thermal energy density to one or more location of the build plane; determining that the thermal energy density is characterized by a density outside a range of density values; and thereafter, adjusting subsequent scans of the energy source across or proximate the one or more locations of the build plane.
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4.发明申请公开(公告)号：US20220324026A1
公开(公告)日：2022-10-13
申请号：US17719729
申请日：2022-04-13
Applicant: Sigma Labs, Inc.
Inventor： Darren Beckett , Martin S. Piltch , Lars Jacquemetton , Alberto M. Castro , Brett Diehl
Abstract: This disclosure describes various methods and apparatus for calibration of temperature sensors in additive manufacturing systems. A method for calibration of temperature sensors can include selecting a first wavelength and a second wavelength spaced apart from the first wavelength; measuring an amount of energy radiated from a black body source at the first wavelength; measuring an amount of energy radiated from the black body source at the second wavelength; generating a relationship between a ratio of the amount of energy radiated at the first wavelength to the amount of energy radiated at the second wavelength; and determining, using the relationship, variations in a temperature of a build plane of an additive manufacturing system based upon a ratio of energy radiated at the first wavelength to energy radiated at the second wavelength.
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公开(公告)号：US20220111444A1
公开(公告)日：2022-04-14
申请号：US17555065
申请日：2021-12-17
Applicant: Sigma Labs, Inc.
Inventor： R. Bruce Madigan , Mark J. Cola , Scott Betts , Darren Beckett , Alberto M. Castro , Lars Jacquemetton , Martin Piltch
IPC: B22F12/00 , B23K26/082 , B33Y50/02 , B33Y10/00 , B29C64/00 , B22F10/00 , B33Y30/00 , B23K26/03 , B23K26/342 , B23K26/06 , B22F10/10
Abstract: This disclosure describes an additive manufacturing system that includes a build plane having a first region and a second region. Multiple energy source can be positioned above the build plane and configured to direct energy into the first and second regions of the build plane. The system includes optical sensors configured to monitor an intensity of light emitted from the energy sources. A processor associated with the additive manufacturing system is configured to adjust the sensor outputs in response to the energy sources coming into close proximity.
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Patent Agency Ranking
公开(公告)号：US20190255614A1
公开(公告)日：2019-08-22
申请号：US16282016
申请日：2019-02-21
Applicant: Sigma Labs, Inc.
Inventor： R. Bruce Madigan , Mark J. Cola , Scott Betts , Darren Beckett , Alberto M. Castro , Lars Jacquemetton , Martin Piltch
IPC: B22F3/105 , B33Y10/00 , B33Y30/00 , B33Y50/02 , B23K26/03 , B23K26/06 , B23K26/082 , B23K26/342
Abstract: This disclosure describes an additive manufacturing system that includes a build plane having a first region and a second region. Multiple energy source can be positioned above the build plane and configured to direct energy into the first and second regions of the build plane. The system includes optical sensors configured to monitor an intensity of light emitted from the energy sources. A processor associated with the additive manufacturing system is configured to adjust the sensor outputs in response to the energy sources coming into close proximity.
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7.发明申请公开(公告)号：US20190039318A1
公开(公告)日：2019-02-07
申请号：US16052488
申请日：2018-08-01
Applicant: Sigma Labs, Inc.
Inventor： R. Bruce Madigan , Lars Jacquemetton , Glenn Wikle , Mark J. Cola , Vivek R. Dave , Darren Beckett , Alberto M. Castro
IPC: B29C64/393 , B22F3/105 , B23K26/03 , B33Y10/00 , B33Y50/02
CPC classification number: B29C64/393 , B22F3/1055 , B22F2003/1057 , B22F2203/11 , B23K15/0086 , B23K26/032 , B23K26/342 , B23K26/70 , B23K31/125 , B23K2101/001 , B33Y10/00 , B33Y50/00 , B33Y50/02
Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensor; determining an area of the build plane traversed during the scans; determining a thermal energy density for the area of the build plane traversed by the scans based upon the amount of energy radiated and the area of the build plane traversed by the scans; mapping the thermal energy density to one or more location of the build plane; determining that the thermal energy density is characterized by a density outside a range of density values; and thereafter, adjusting subsequent scans of the energy source across or proximate the one or more locations of the build plane.
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8.发明申请公开(公告)号：US20220388249A1
公开(公告)日：2022-12-08
申请号：US17839853
申请日：2022-06-14
Applicant: Sigma Labs, Inc.
Inventor： R. Bruce Madigan , Lars Jacquemetton , Glenn Wikle , Mark J. Cola , Vivek R. Dave , Darren Beckett , Alberto M. Castro
IPC: B29C64/393 , B33Y10/00 , B33Y50/00 , B33Y50/02 , B23K26/342 , B23K26/70 , B23K15/00 , B23K26/03 , B23K31/12 , B22F10/20
Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensor; determining an area of the build plane traversed during the scans; determining a thermal energy density for the area of the build plane traversed by the scans based upon the amount of energy radiated and the area of the build plane traversed by the scans; mapping the thermal energy density to one or more location of the build plane; determining that the thermal energy density is characterized by a density outside a range of density values; and thereafter, adjusting subsequent scans of the energy source across or proximate the one or more locations of the build plane.
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公开(公告)号：US11260456B2
公开(公告)日：2022-03-01
申请号：US17003330
申请日：2020-08-26
Applicant: Sigma Labs, Inc.
Inventor： R. Bruce Madigan , Mark J. Cola , Scott Betts , Darren Beckett , Alberto M. Castro , Lars Jacquemetton , Martin Piltch
IPC: B22F3/105 , B33Y10/00 , B33Y30/00 , B33Y50/02 , B23K26/06 , B23K26/082 , B23K26/342 , B23K26/03 , B29C64/00 , B22F12/00 , B22F10/00 , B22F10/10
Abstract: This disclosure describes an additive manufacturing system that includes a build plane having a first region and a second region. Multiple energy source can be positioned above the build plane and configured to direct energy into the first and second regions of the build plane. The system includes optical sensors configured to monitor an intensity of light emitted from the energy sources. A processor associated with the additive manufacturing system is configured to adjust the sensor outputs in response to the energy sources coming into close proximity.
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公开(公告)号：US10786850B2
公开(公告)日：2020-09-29
申请号：US16282016
申请日：2019-02-21
Applicant: Sigma Labs, Inc.
Inventor： R. Bruce Madigan , Mark J. Cola , Scott Betts , Darren Beckett , Alberto M. Castro , Lars Jacquemetton , Martin Piltch
IPC: B22F3/105 , B33Y30/00 , B33Y50/02 , B23K26/03 , B23K26/06 , B23K26/082 , B23K26/342 , B33Y10/00 , B29C64/00
Abstract: This disclosure describes an additive manufacturing system that includes a build plane having a first region and a second region. Multiple energy source can be positioned above the build plane and configured to direct energy into the first and second regions of the build plane. The system includes optical sensors configured to monitor an intensity of light emitted from the energy sources. A processor associated with the additive manufacturing system is configured to adjust the sensor outputs in response to the energy sources coming into close proximity.
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