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公开(公告)号:US20240087979A1
公开(公告)日:2024-03-14
申请号:US18511390
申请日:2023-11-16
Applicant: Solid-tech Co., Ltd.
Inventor: Tzu Chien Hung , Chun-Teng Ko , Bomin Tu , Zhengyu Lee
IPC: H01L23/373 , H01L21/48 , H01L23/00 , H01L23/13
CPC classification number: H01L23/3735 , H01L21/4846 , H01L23/13 , H01L24/29 , H01L24/32 , H01L2224/29109 , H01L2224/29111 , H01L2224/29113 , H01L2224/29144 , H01L2224/29147 , H01L2224/32238 , H01L2924/01322 , H01L2924/0133 , H01L2924/0134 , H01L2924/12042 , H01L2924/13055
Abstract: This invention provides a carrier or submount for high power devices packaging and a method for forming the carrier or submount. The carrier comprises a thermal conductive ceramic substrate with at least one recess region, a patterned adhesion layer on the substrate, a heat dissipation layer on the patterned adhesion layer, a conformal cover layer enclosing the heat dissipation layer and the adhesion layer, a diffusion barrier layer on the conformal cover layer, and an eutectic bonding layer on the diffusion barrier layer. The substrate includes a first region for bonding high power device, a second region for wire-bonding, and a third region for heat sink. The first region and second region are on a first surface of the substrate, and the third region is one the second surface, opposite to the first surface, of the substrate.
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公开(公告)号:US20240120244A1
公开(公告)日:2024-04-11
申请号:US18511421
申请日:2023-11-16
Applicant: Solid-tech Co., Ltd.
Inventor: Tzu Chien HUNG , Chun-Teng Ko , Bomin Tu , Zhengyu Lee
Abstract: This invention provides a carrier or submount for high power devices packaging and a method for forming the carrier or submount. The carrier comprises a thermal conductive ceramic substrate, a patterned adhesion layer on the substrate, a heat dissipation layer on the patterned adhesion layer, a conformal cover layer enclosing the heat dissipation layer and the adhesion layer, a lateral heat dissipation layer on the substrate and between the cover layer on the first region and the cover layer on the second region, a diffusion barrier layer on the conformal cover layer, and an eutectic bonding layer on the diffusion barrier layer. The substrate includes a first region for bonding high power device, a second region for wire-bonding, and a third region for heat sink. The first region and second region are on a first surface of the substrate, and the third region is one the second surface, opposite to the first surface, of the substrate.
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