2-oxo-4-carboxy-pyrimidines and their use as anti-malaria and
anti-cancer agents
    1.
    发明授权
    2-oxo-4-carboxy-pyrimidines and their use as anti-malaria and anti-cancer agents 失效
    2-氧代-4-羧基嘧啶及其作为抗疟剂和抗癌剂的用途

    公开(公告)号:US4873228A

    公开(公告)日:1989-10-10

    申请号:US91761

    申请日:1987-09-01

    Abstract: A compound for use as an inhibitor for the enzyme dihydroorotase and which is of general formula (I) ##STR1## where either (i) A and B together are .dbd.Sor(ii) A is --H, and B is --COR.sub.2 or --SR.sub.6 ; andR.sub.1 and R.sub.2 which may be the same or different are --OH; alkyloxymethyl, a di-, tri- or polypeptide group, --OR where R is saturated or unsaturated C.sub.1-16 alkyl, C.sub.1-16 alkyloxymethyl, or 4-alkyl-piperidinyl-alkyl, --NR'R' where each R' is independently selected from --H, saturated or unsaturated C.sub.1-16 alkyl, or any group above to be hydrolyzed in vivo to hydroxy;R.sub.3 and R.sub.4 which may be the same or different are --H, C.sub.1-6 alkyl, hydroxy C.sub.1-16 alkyl, hydroxy C.sub.1-6 ether group, tetrahydrofuranyl, tetrahydropyranyl, a sugar or acetylated sugar group, hexylcarbamyl, methylglycine-N-carbonyl, or any group able to be hydrolyzed in vivo to --H;R.sub.5 is --H, halo, or C.sub.1-6 alkyl;R.sub.6 is C.sub.1-6 alkyl or 1-methyl-4-nitroimidazol-5-yl; and the dotted line represents a double bond which may be absent or present in the 4-5 position. The compounds are useful as anti-cancer and anti-malarial drugs.

    Abstract translation: 用作二氢乳清酶的抑制剂的化合物,其通式(I)其中(i)A和B一起为S或(ii)A为-H,B为 -COR2或-SR6; 可以相同或不同的R 1和R 2是-OH; 烷氧基甲基,二或三或多肽基团-OR,其中R是饱和或不饱和的C1-16烷基,C1-16烷氧基甲基或4-烷基 - 哌啶基 - 烷基,-NR'R',其中每个R'独立地 选自-H,饱和或不饱和的C1-16烷基,或任何上述待在体内水解成羟基的基团; 可以相同或不同的R 3和R 4是-H,C 1-6烷基,羟基C 1-6烷基,羟基C 1-6醚基,四氢呋喃基,四氢吡喃基,糖或乙酰化的糖基,己基氨基甲酰基,甲基甘氨酸-N-羰基 ,或任何能够在体内水解成-H的组; R5是-H,卤素或C1-6烷基; R6是C1-6烷基或1-甲基-4-硝基咪唑-5-基; 虚线表示可以不存在或存在于4-5位的双键。 该化合物可用作抗癌和抗疟药。

    Switchable holographic gratings
    2.
    发明授权
    Switchable holographic gratings 失效
    可切换全息光栅

    公开(公告)号:US07625674B2

    公开(公告)日:2009-12-01

    申请号:US10958669

    申请日:2004-10-04

    Abstract: The present invention includes systems and compositions of holographic grating structures devices and methods for fabricating such holographic grating structures. The method comprises the steps of preparing a composite mixture comprising a polymerizable matrix, a liquid crystal, and a photo-oxidant dye, producing an interference pattern from two interference beams, wherein the two interference beams originate from a recording laser beam directed by a low energy laser, and projecting the interference pattern on the composite mixture to form a holographic grating structure. As described, the holographic grating structure yields a first-order diffraction efficiency of at least about 30% diffraction efficiency which may be adjusted by the application of an electric field.

    Abstract translation: 本发明包括全息光栅结构装置的系统和组成以及用于制造这种全息光栅结构的方法。 该方法包括以下步骤:制备包含可聚合基质,液晶和光氧化染料的复合混合物,从两个干涉光束产生干涉图案,其中两个干涉光束源于由低 并且将干涉图案投影在复合混合物上以形成全息光栅结构。 如所描述的,全息光栅结构产生至少约30%衍射效率的一级衍射效率,其可以通过施加电场来调节。

    Semiconductor chip-based radiation detector
    3.
    发明授权
    Semiconductor chip-based radiation detector 有权
    基于半导体芯片的辐射探测器

    公开(公告)号:US07166851B2

    公开(公告)日:2007-01-23

    申请号:US10392397

    申请日:2003-03-19

    Inventor: Suresh C. Sharma

    CPC classification number: G01T1/204

    Abstract: The present invention is a self-contained device for measuring exposure to radiation which includes an integrated circuit device incorporating a polymer dispersed liquid crystal component that resides on a semiconductor substrate.

    Abstract translation: 本发明是用于测量暴露于辐射的独立装置,其包括集成在半导体衬底上的聚合物分散液晶组件的集成电路装置。

    Radiation detector using polymer-dispersed liquid crystal cell
    4.
    发明授权
    Radiation detector using polymer-dispersed liquid crystal cell 失效
    使用聚合物分散液晶单元的辐射检测器

    公开(公告)号:US06683309B2

    公开(公告)日:2004-01-27

    申请号:US10028353

    申请日:2001-12-21

    Inventor: Suresh C. Sharma

    CPC classification number: G01T1/204 G02F1/1334

    Abstract: Generally, and in one form, the present invention is a device for the measurement of radiant energy using a polymer dispersed liquid crystal cell. In another form, the present invention is a device for the detection of ionizing radiation that uses a polymer dispersed liquid crystal cell and a light source that is optically oriented toward the cell. The cell is connected to an electrical signal generator, and a light detector capable of producing output is optically aligned with the light source. Finally, a computer is connected to the light detector to analyze the output from the light detector.

    Abstract translation: 通常,在一种形式中,本发明是使用聚合物分散液晶单元测量辐射能的装置。 在另一种形式中,本发明是用于检测使用聚合物分散液晶单元的电离辐射的装置和光学取向于电池的光源。 电池连接到电信号发生器,并且能够产生输出的光检测器与光源光学对准。 最后,将计算机连接到光检测器以分析来自光检测器的输出。

    Apparatus and method for rapid and nondestructive determination of
lattice defects in semiconductor materials
    5.
    发明授权
    Apparatus and method for rapid and nondestructive determination of lattice defects in semiconductor materials 失效
    用于快速和无损地测定半导体材料中晶格缺陷的装置和方法

    公开(公告)号:US5406085A

    公开(公告)日:1995-04-11

    申请号:US88482

    申请日:1993-07-07

    Inventor: Suresh C. Sharma

    CPC classification number: G01N23/22

    Abstract: A method and apparatus for rapidly yet nondestructively testing a semiconductor wafer is disclosed. A multi-spot positron source assembly directs positrons over an entire semiconductor wafer at one time. A pair of multi-detector assemblies are situated so that each detector within an assembly corresponds physically with a positron source. By measuring the characteristic emission and annihilation energies, the multi-detector assembly pair is capable of detecting the lifetimes of positrons from within each of the areas simultaneously. Longer lifetimes are indicative of defects within the semiconductor wafer. By accumulating and analyzing positron lifetimes from across the entire wafer substantially simultaneously, information about the existence and location of defects in the wafer may be more rapidly determined than is possible with known positron-emission techniques.

    Abstract translation: 公开了用于快速且非破坏性地测试半导体晶片的方法和装置。 多点正电子源组件一次将正电子引导到整个半导体晶片上。 一对多检测器组件被定位成使得组件内的每个检测器物理地与正电子源对应。 通过测量特征发射和湮灭能量,多检测器组件对能够同时检测每个区域内正电子的寿命。 更长的寿命表明半导体晶片内的缺陷。 基本上同时累积和分析整个晶片的正电子寿命,关于晶片缺陷的存在和位置的信息可以比已知的正电子发射技术更可靠地确定。

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