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1.Electron probe micro-analysis with specific x-ray spectrometer structure 失效
Title translation: 电子探针微分析与特定X射线光谱仪结构公开(公告)号:US3365574A
公开(公告)日:1968-01-23
申请号:US42922765
申请日:1965-02-01
Applicant: TI GROUP SERVICES LTD
Inventor: PETER DUNCUMB
IPC: H01J37/252
CPC classification number: H01J37/252
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2.Method for the analysis of x-rays from an electron probe device 失效
Title translation: 用于分析来自电子探针装置的X射线的方法公开(公告)号:US3260845A
公开(公告)日:1966-07-12
申请号:US20871762
申请日:1962-07-10
Applicant: TI GROUP SERVICES LTD
Inventor: PETER DUNCUMB
IPC: G01N23/225
CPC classification number: G01N23/225
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