公开(公告)号：US12085712B2

公开(公告)日：2024-09-10

申请号：US17339059

申请日：2021-06-04

Applicant: TOPPAN PRINTING CO., LTD.

Inventor： Mai Yoshimura ,  Masashi Kawashita

IPC: G02B27/00 ,  G02B5/18

CPC classification number: G02B27/0037 ,  G02B5/1857 ,  G02B5/1866

Abstract: A display with a plurality of display elements each composed of an uneven layer having an uneven structure and a multilayer film layer provided on the uneven structure. A pattern formed by convexities can be divided into shape elements each arranged in each of a plurality of virtual rectangles, when viewed from a direction facing the uneven layer, and each of the shape elements arranged in each of the virtual rectangles is inscribed in the rectangle in which the shape element is arranged. The plurality of virtual rectangles each have sides along a first direction and sides along a second direction orthogonal to the first direction, and a length of the side along the first direction is less than or equal to a sub wavelength.

公开(公告)号：US20190329527A1

公开(公告)日：2019-10-31

申请号：US16508010

申请日：2019-07-10

Applicant: TOPPAN PRINTING CO., LTD.

Inventor： Mai Yoshimura ,  Kyoko Sakai ,  Yoko Ichihara ,  Masashi Kawashita ,  Naoki Minamikawa

IPC: B32B7/02 ,  B32B3/30 ,  G02B5/18

Abstract: A color developing structure has an uneven layer with an uneven structure on a surface thereof, a multilayer film layer positioned on the uneven structure and having a surface shape that follows the uneven structure, and a protective layer covering the surface of the multilayer film layer. Projections that constitute the uneven structure have a shape with one or more steps, a pattern constituted from projected images of the projections in a virtual plane on which the uneven structure is projected in the thickness direction of the uneven layer includes a pattern comprising a set of a plurality of rectangles in which a length along a second direction is equal to or greater than a length along a first direction, the length of the rectangles along the first direction is equal to or less than subdirection is greater than the standard deviation of the length along the first direction.