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公开(公告)号：US20250116852A1
公开(公告)日：2025-04-10
申请号：US18906687
申请日：2024-10-04
Applicant: Trustees of Boston University
Inventor： Ji-Xin Cheng , Hongli Ni , Yuhao Yuan
Abstract: A short-wave infrared photothermal (SWIP) microscopy system and method for vibrational imaging of a sample generates shortwave infrared excitation light probe light. The excitation light and the probe light are combined to generate a combined beam, which is focused to generate a focused combined beam, which is directed onto the sample to obtain a SWIP signal generated by absorption-induced thermo-optic selective heating of the sample. The SWIP signal is collected through an aperture in a condenser and detected.
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