公开(公告)号：US12196681B1

公开(公告)日：2025-01-14

申请号：US18770918

申请日：2024-07-12

Applicant: UNITY SEMICONDUCTOR

Inventor： Hadrien Vergnet

IPC: G01N21/64 ,  G01N21/95

Abstract: A device for detecting monocrystalline substrate defects, wherein a normal to the surface of the substrate is tilted by a tilt angle being contained in an angle plane, perpendicular to the surface, the device includes a detector, an illumination light source having a light beam, and arranged in a first position and/or a second position, an excitation light source illuminating the substrate and producing an emission of photoluminescence light by the substrate, imaging means imaging the substrate according to a detector field of view producing at least one image of the substrate, and processing means detecting crystalline defects using the substrate image, each illumination light source and the imaging means are arranged in a dark-field configuration, and in the first position, the illuminating light beam is parallel or quasi-parallel to the angle plane, and in the second position, the illuminating light beam is parallel or quasi-parallel to a perpendicular plane.