METHOD OF REPLICATING A MICROSTRUCTURE PATTERN

    公开(公告)号:US20220390833A1

    公开(公告)日:2022-12-08

    申请号:US17338118

    申请日:2021-06-03

    Inventor: Riberet ALMEIDA

    Abstract: A method of replicating a microstructure pattern includes providing a multilayer structure including a substrate, a thin film, and a positive tone photoresist; providing a mold having a microstructure pattern; applying the mold to the multilayer structure under pressure and temperature; wherein the microstructure pattern of the mold is replicated onto the positive tone photoresist of the multilayer structure. An article including a substrate, and a thin film having a microstructure pattern is also disclosed.

    METHOD OF REPLICATING A MICROSTRUCTURE PATTERN

    公开(公告)号:US20220390839A1

    公开(公告)日:2022-12-08

    申请号:US17338144

    申请日:2021-06-03

    Inventor: Riberet ALMEIDA

    Abstract: A method includes providing a first multilayer structure including a substrate, a thin film, and a first photoresist layer; providing a second multilayer structure including a mold having a microstructure pattern, and a second photoresist layer; combining the first multilayer structure and the second multilayer structure so that the first photoresist layer is in contact with the second photoresist layer; and applying pressure and temperature. An article including a microstructure pattern is also disclosed.

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