公开(公告)号：US20240328896A1

公开(公告)日：2024-10-03

申请号：US18191545

申请日：2023-03-28

Applicant: VIAVI Solutions Inc.

Inventor： Jay Gregory BRACE ,  Robert Matthew ADAMS ,  Eugene CHAN

IPC: G01M11/00

CPC classification number: G01M11/33

Abstract: In some implementations, a device may selectively illuminate, via a lighting module of the device, one or more fibers in a fiber optic cable using an illumination pattern. The device may detect, via a detection module of the device, illuminated fibers associated with the fiber optic cable based on the illumination pattern. The device may output, via the detection module of the device, information regarding the illuminated fibers. The device may generate, via one or more processors of the device, a report, based on the information, indicating a fiber mapping between the one or more fibers that were selectively illuminated via the lighting module and the illuminated fibers detected via the detection module.

公开(公告)号：US20220390322A1

公开(公告)日：2022-12-08

申请号：US17341261

申请日：2021-06-07

Applicant: VIAVI SOLUTIONS INC.

Inventor： Luis Andre Neves Paiva FERNANDES ,  Robert Matthew ADAMS ,  Christopher Russell WAGNER ,  Joshua Benjamin Julius PHILIPSON ,  Eugene CHAN

IPC: G01M11/00 ,  G02F1/01

Abstract: According to examples, a system for measuring polarization dependent loss (PDL) for a device-under-test (DUT) may include a tunable laser, a polarization element and a power meter. The tunable laser may emit an optical signal to sweep across an optical band at a constant rate. The polarization element may scramble polarizations states of the optical signal emitted from the tunable laser. The power meter may take power measurements associated with the optical signal emitted from the tunable laser, wherein the power measurements from the power meter are used to determine a maximum insertion loss (IL) and a minimum insertion loss (IL) associated with the device-under-test (DUT). An average insertion loss (IL) and a polarization dependent loss (PDL) for the device-under-test (DUT) may be calculated based on the maximum insertion loss (IL) and the minimum insertion loss (IL) associated with the device-under-test (DUT).