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公开(公告)号:US12038346B2
公开(公告)日:2024-07-16
申请号:US17341261
申请日:2021-06-07
Applicant: VIAVI SOLUTIONS INC.
Inventor: Luis Andre Neves Paiva Fernandes , Robert Matthew Adams , Christopher Russell Wagner , Joshua Benjamin Julius Philipson , Eugene Chan
CPC classification number: G01M11/337 , G02F1/0139
Abstract: According to examples, a system for measuring polarization dependent loss (PDL) for a device-under-test (DUT) may include a tunable laser, a polarization element and a power meter. The tunable laser may emit an optical signal to sweep across an optical band at a constant rate. The polarization element may scramble polarizations states of the optical signal emitted from the tunable laser. The power meter may take power measurements associated with the optical signal emitted from the tunable laser, wherein the power measurements from the power meter are used to determine a maximum insertion loss (IL) and a minimum insertion loss (IL) associated with the device-under-test (DUT). An average insertion loss (IL) and a polarization dependent loss (PDL) for the device-under-test (DUT) may be calculated based on the maximum insertion loss (IL) and the minimum insertion loss (IL) associated with the device-under-test (DUT).