公开(公告)号：US20130113511A1

公开(公告)日：2013-05-09

申请号：US13289382

申请日：2011-11-04

Applicant: Wayne C. Goeke ,  William Knauer

Inventor： Wayne C. Goeke ,  William Knauer

IPC: G01R1/073

CPC classification number: G01R1/06766 ,  G01R1/00 ,  G01R1/073 ,  G01R1/18 ,  G01R3/00 ,  G01R31/31926

Abstract: A DC-AC probe card for testing a DUT includes: a plurality of probe needles, each probe needle having a distal end for contacting said DUT; and a plurality of connection pathways operable to connect test instrumentation to the probe needles, wherein each connection pathway provides both a desired characteristic impedance for AC measurements and a guarded pathway for DC measurements between respective test instrument connections and probe needles.

Abstract translation: 用于测试DUT的DC-AC探针卡包括：多个探针，每个探针具有用于接触所述DUT的远端; 以及可操作以将测试仪器连接到探针的多个连接通道，其中每个连接通道提供用于AC测量的所需特性阻抗和用于各测试仪器连接件和探针之间的DC测量的保护通路。

公开(公告)号：US06900649B1

公开(公告)日：2005-05-31

申请号：US10669585

申请日：2003-09-23

Applicant: William Knauer

Inventor： William Knauer

IPC: G01R1/04 ,  G01R1/067 ,  G01R31/28 ,  G01R31/02

CPC classification number: G01R31/2889 ,  G01R1/06772

Abstract: A RF test interconnection system for connecting a measurement device to a device under test includes, a probe card having a probe extending from a first side of the card for making electrical contact with the device under test and a coaxial connector extending from a second side of the card, a test head having a test head coaxial connector that will mate with the probe card coaxial connector when the probe card and the test head are urged together, and a de-mating device attached to either the probe card or the test head for urging the probe card and the test head apart by applying a separating force therebetween. The probe card and the test card coaxial connectors are electrically connected when the test head and the probe card are urged together by a connection force and electrically disconnected when the connection force is removed.

Abstract translation: 用于将测量设备连接到被测设备的RF测试互连系统包括：探针卡，其具有从卡的第一侧延伸的用于与被测器件电接触的探针;以及从第二侧延伸的同轴连接器 所述卡，具有测试头同轴连接器的测试头，当所述探针卡和所述测试头一起被推动时，所述测试头同轴连接器将与所述探针卡同轴连接器配合;以及去配对装置，其连接到所述探针卡或所述测试头 通过在其间施加分离力来将探针卡和测试头分开。 当测试头和探针卡通过连接力一起推动时，探针卡和测试卡同轴连接器电连接，当连接力消除时，探针卡和测试卡同轴连接器电连接。

公开(公告)号：US5808475A

公开(公告)日：1998-09-15

申请号：US660441

申请日：1996-06-07

Applicant: William Knauer ,  Robert Bennett

Inventor： William Knauer ,  Robert Bennett

IPC: G01R1/04 ,  G01R1/073

CPC classification number: G01R1/07378 ,  G01R1/04 ,  G01R1/07342

Abstract: A semiconductor probe card is provided with low dielectric absorption feed-through contacts to isolate test lines from printed circuit board leakage effects.

Abstract translation: 半导体探针卡具有低介电吸收馈通触点，以将测试线与印刷电路板的泄漏效应隔离开来。

公开(公告)号：US07425837B2

公开(公告)日：2008-09-16

申请号：US11436821

申请日：2006-05-18

Applicant: William Knauer ,  Eric Saint-Etienne ,  Vincent Reynaud

Inventor： William Knauer ,  Eric Saint-Etienne ,  Vincent Reynaud

IPC: G01R31/02

CPC classification number: G01R31/2889 ,  G01R31/316

Abstract: A spatial transformer includes an insulating substrate; a plurality of test terminal assemblies on the substrate; and a plurality of contact surfaces on the transformer, each providing an interconnection point for electrical connection between a respective test terminal assembly and a device under test. Each test terminal assembly has a center conductor trace on an upper substrate surface; a lower substrate guard trace beneath the center conductor trace; and a pair of upper substrate guard traces adjacent to opposite sides of the center conductor trace, the guard traces being electrically interconnected. The guard traces in combination with the center conductor trace provide a desired characteristic impedance for an RF signal applied therebetween or a guarded DC connection for a DC signal applied to the center conductor trace and a DC guard applied to the guard traces.

Abstract translation: 空间变压器包括绝缘衬底; 在基板上的多个测试端子组件; 以及变压器上的多个接触表面，每个提供用于相应测试端子组件和被测器件之间的电连接的互连点。 每个测试端子组件在上基板表面上具有中心导体迹线; 在中心导体迹线下面的下基板保护迹线; 以及与中心导体迹线的相对侧相邻的一对上基板保护迹线，保护迹线电互连。 与中心导体迹线组合的保护迹线为施加在其间的RF信号提供期望的特性阻抗，或者对施加到中心导体迹线的DC信号的保护DC连接以及施加到保护迹线的DC保护。

公开(公告)号：US5559482A

公开(公告)日：1996-09-24

申请号：US446896

申请日：1995-05-17

Applicant: Robert R. Close ,  William Knauer

Inventor： Robert R. Close ,  William Knauer

IPC: H01H51/28 ,  H01H1/66

CPC classification number: H01H51/281

Abstract: A reed relay is provided with two shields. The shields are fabricated from copper foil and insulated from each other by polyester tape or film. One shield is connected to one lead of a switching element and the other shield is connected to another lead of a switching element. The shields are wrapped around the switching element in an overlapping manner. The dual shield configuration reduces leakage and interference to improve performance, particularly in low current applications.

Abstract translation: 簧片继电器配有两个屏蔽。 屏蔽由铜箔制成，并通过聚酯胶带或胶片彼此绝缘。 一个屏蔽连接到开关元件的一个引线，另一个屏蔽连接到开关元件的另一引线。 屏蔽以重叠的方式缠绕在开关元件周围。 双屏蔽配置减少了泄漏和干扰，以提高性能，特别是在低电流应用中。

公开(公告)号：US07683647B1

公开(公告)日：2010-03-23

申请号：US12205271

申请日：2008-09-05

Applicant: Carl Scharrer ,  Dave Rose ,  Martin J. Rice ,  James A. Niemann ,  William F. Merkel ,  Warren Kumley ,  William Knauer ,  Wayne C. Goeke

Inventor： Carl Scharrer ,  Dave Rose ,  Martin J. Rice ,  James A. Niemann ,  William F. Merkel ,  Warren Kumley ,  William Knauer ,  Wayne C. Goeke

IPC: G01R31/02 ,  G01R31/26

CPC classification number: G01R31/2889

Abstract: A test head for testing a DUT includes a probe card having a plurality of DUT probes, the probes being in contact with the DUT during the testing; an instrument carrier, the instrument carrier being located above the DUT during the testing; and a SMU mounted on the carrier for each of the probes, each SMU being operably connectable to a respective probe, wherein the carrier is moved with respect to the probe card to permit replacement of the probe card.

Abstract translation: 用于测试DUT的测试头包括具有多个DUT探针的探针卡，在测试期间探针与DUT接触; 仪器载体，仪器载体在测试期间位于DUT的上方; 以及安装在每个探针的载体上的SMU，每个SMU可操作地连接到相应的探针，其中载体相对于探针卡移动以允许更换探针卡。

公开(公告)号：US20070268030A1

公开(公告)日：2007-11-22

申请号：US11436821

申请日：2006-05-18

Applicant: William Knauer ,  Eric Saint-Etienne ,  Vincent Reynaud

Inventor： William Knauer ,  Eric Saint-Etienne ,  Vincent Reynaud

IPC: G01R31/02

CPC classification number: G01R31/2889 ,  G01R31/316

Abstract: A spatial transformer includes an insulating substrate; a plurality of test terminal assemblies on the substrate; and a plurality of contact surfaces on the transformer, each providing an interconnection point for electrical connection between a respective test terminal assembly and a device under test. Each test terminal assembly has a center conductor trace on an upper substrate surface; a lower substrate guard trace beneath the center conductor trace; and a pair of upper substrate guard traces adjacent to opposite sides of the center conductor trace, the guard traces being electrically interconnected. The guard traces in combination with the center conductor trace provide a desired characteristic impedance for an RF signal applied therebetween or a guarded DC connection for a DC signal applied to the center conductor trace and a DC guard applied to the guard traces.

Abstract translation: 空间变压器包括绝缘衬底; 在基板上的多个测试端子组件; 以及变压器上的多个接触表面，每个提供用于相应测试端子组件和被测器件之间的电连接的互连点。 每个测试端子组件在上基板表面上具有中心导体迹线; 在中心导体迹线下面的下基板保护迹线; 以及与中心导体迹线的相对侧相邻的一对上基板保护迹线，保护迹线电互连。 与中心导体迹线组合的保护迹线为施加在其间的RF信号提供期望的特性阻抗，或者对施加到中心导体迹线的DC信号的保护DC连接以及施加到保护迹线的DC保护。

公开(公告)号：US5644115A

公开(公告)日：1997-07-01

申请号：US436018

申请日：1995-05-05

Applicant: William Knauer

Inventor： William Knauer

IPC: H01H67/24 ,  H01H51/00 ,  H01H1/66 ,  H01H67/02

CPC classification number: H01H67/24

Abstract: A matrix of three pole, high speed, low current relays for connecting test equipment to a device under test is provided with improved interconnect buses. The relays are mounted in rows and columns with their three pairs of leads extending vertically. An input interconnect bar having three conductors extends horizontally along each row of relays, each conductor being connected to a respective one of each pair of leads. A bottom interconnect bar having three buses extends perpendicular to the top interconnect bars along each column of relays, each bus being connected to a respective one of the leads. The ends of the leads are aligned at a 45.degree. angle with respect to the interconnects. The interconnect bars are enclosed in shielding guard tubes and are removable to permit replacement of the relays.

Abstract translation: 提供了一种用于将测试设备连接到被测设备的三极，高速，低电流继电器矩阵，改进了互连总线。 继电器安装成行和列，其三对导线垂直延伸。 具有三个导体的输入互连条沿着每排继电器水平延伸，每个导体连接到每对引线中的相应一个。 具有三个总线的底部互连条沿着每列继电器垂直于顶部互连条延伸，每个总线连接到相应的一个引线。 引线的端部相对于互连件以45°的角度排列。 互连条被封装在屏蔽保护管中，并且可拆卸以允许更换继电器。

公开(公告)号：US08717053B2

公开(公告)日：2014-05-06

申请号：US13289382

申请日：2011-11-04

Applicant: Wayne C. Goeke ,  William Knauer

Inventor： Wayne C. Goeke ,  William Knauer

IPC: G01R31/00 ,  G01R31/02 ,  G01R1/067 ,  G01R1/073 ,  G01R1/18 ,  G01R1/00 ,  G01R31/319 ,  G01R3/00

CPC classification number: G01R1/06766 ,  G01R1/00 ,  G01R1/073 ,  G01R1/18 ,  G01R3/00 ,  G01R31/31926

Abstract: A DC-AC probe card for testing a DUT includes: a plurality of probe needles, each probe needle having a distal end for contacting said DUT; and a plurality of connection pathways operable to connect test instrumentation to the probe needles, wherein each connection pathway provides both a desired characteristic impedance for AC measurements and a guarded pathway for DC measurements between respective test instrument connections and probe needles.

Abstract translation: 用于测试DUT的DC-AC探针卡包括：多个探针，每个探针具有用于接触所述DUT的远端; 以及可操作以将测试仪器连接到探针的多个连接通道，其中每个连接通道提供用于AC测量的所需特性阻抗和用于各测试仪器连接件和探针之间的DC测量的保护通路。

公开(公告)号：US07920038B1

公开(公告)日：2011-04-05

申请号：US12123848

申请日：2008-05-20

Applicant: William Knauer

Inventor： William Knauer

IPC: H01H1/66

CPC classification number: H01H51/28 ,  H01H50/10

Abstract: Provided is a relay that includes first and second contacts that are selectively connectable for closing an electric circuit. A coil wound around the contacts along a longitudinal axis can generate a magnetic field that connects the contacts in one of an energized or de-energized state and disconnects the contacts in the other of the energized or de-energized state. A first electrically conductive shield is provided adjacent to a first end of the relay and electrically connected to the first contact, and a second electrically conductive shield, the second electrically conductive shield being electrically connected to the second contact. The first electrically conductive shield extends at least partially around the first contact and the second electrically conductive shield extends at least partially around the second contact. The second electrically conductive shield is substantially coaxial with the first electrically conductive shield and separated a distance apart from the first electrically conductive shield along the longitudinal axis.

Abstract translation: 提供了一种继电器，其包括可选择地连接用于闭合电路的第一和第二触点。 沿着纵向轴线缠绕在触点周围的线圈可以产生磁场，其以一个通电状态或断电状态连接触头，并且在另一个通电或去电状态下断开触点。 第一导电屏蔽被设置成与继电器的第一端相邻并且电连接到第一触点和第二导电屏蔽，第二导电屏蔽电连接到第二触点。 第一导电屏蔽件至少部分地围绕第一触点延伸，并且第二导电屏蔽件至少部分地围绕第二触点延伸。 第二导电屏蔽件与第一导电屏蔽件基本上同轴，并且沿着纵向轴线与第一导电屏蔽件分开一段距离。