公开(公告)号：US09575116B2

公开(公告)日：2017-02-21

申请号：US14156723

申请日：2014-01-16

Applicant: Wolfson Microelectronics plc

Inventor： Colin Findlay Steele ,  John L. Pennock

IPC: G01R31/08 ,  G01R31/12 ,  G01R31/28 ,  H04R29/00 ,  H04R19/00

CPC classification number: G01R31/2829 ,  B81B7/008 ,  B81C99/004 ,  G01R31/2884 ,  H01L2224/05554 ,  H01L2224/48091 ,  H01L2224/48137 ,  H04R19/005 ,  H04R29/004 ,  H04R2201/003 ,  H01L2924/00014

Abstract: A method of testing a capacitive transducer circuit, for example a MEMS capacitive transducer, by applying a test signal via one or more capacitors provided in the transducer circuit.

Abstract translation: 通过经由设置在换能器电路中的一个或多个电容器施加测试信号来测试电容式换能器电路，例如MEMS电容换能器的方法。