DETECTION DEVICE COMPRISING A RUGGED TEST CIRCUIT
    1.
    发明申请
    DETECTION DEVICE COMPRISING A RUGGED TEST CIRCUIT 失效
    检测设备,包含一个有害的测试电路

    公开(公告)号:US20120138776A1

    公开(公告)日:2012-06-07

    申请号:US13313526

    申请日:2011-12-07

    Applicant: Xavier LEFOUL

    Inventor: Xavier LEFOUL

    CPC classification number: G01J1/02 G01J1/0228 G01J1/44 H01L27/1443

    Abstract: The detection device comprises a photodetector provided with first and second terminals. A readout circuit has an input coupled to the first terminal of the photodetector. A bias circuit imposes a bias on the terminals of the photodetector. A test circuit delivers a test current to the photodetector. The test circuit comprises a first transistor through which the test current flows. The first transistor presents a first main electrode connected to the input of the readout circuit and configured so as to have a junction diode opposing flow of the charge carriers when the photodetector is short-circuited.

    Abstract translation: 检测装置包括设置有第一和第二端子的光电检测器。 读出电路具有耦合到光电检测器的第一端子的输入。 偏置电路对光电检测器的端子施加偏压。 测试电路向光电检测器传送测试电流。 测试电路包括测试电流流经的第一晶体管。 第一晶体管呈现连接到读出电路的输入端的第一主电极,并配置成当光电检测器短路时具有与电荷载流子相反的结二极管。

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