Systems and methods for sensing marking substrate area coverage using a spectrophotometer
    1.
    发明申请
    Systems and methods for sensing marking substrate area coverage using a spectrophotometer 有权
    使用分光光度计感测标记衬底区域覆盖的系统和方法

    公开(公告)号:US20030086103A1

    公开(公告)日:2003-05-08

    申请号:US09985419

    申请日:2001-11-02

    CPC classification number: H04N1/6033 G03G2215/00042

    Abstract: A multiple-LED sensor is used to detect area coverage of marked patches on a marking substrate. The same sensor may also be used for color calibration. The marking substrate area coverage sensor obtains reflectance measurements from marked patches of a marking substrate. For example, the marked patches may be patches of a marking substance such as toner, ink or paint, or patches marked by etching or the like. A Neugebauer model may be used to obtain the reflectance measurements. A batch least squares algorithm may be used to estimate the appropriate parameters of the Neugebauer model. For improved accuracy, a recursive least squares algorithm may be used. The recursive least squares algorithm allows the marking substrate area coverage sensor to calibrate itself to changes in the sensing environment.

    Abstract translation: 多LED传感器用于检测标记基板上标记贴片的面积。 同样的传感器也可以用于颜色校准。 标记衬底区域覆盖传感器从标记衬底的标记贴片获得反射率测量值。 例如,标记的贴片可以是标记物质的补片,例如调色剂,墨水或油漆,或者通过蚀刻等标记的贴片。 可以使用Neugebauer模型来获得反射率测量。 可以使用批量最小二乘法来估计Neugebauer模型的适当参数。 为了提高精度,可以使用递归最小二乘法算法。 递归最小二乘算法允许标记衬底区域覆盖传感器自身校准感测环境中的变化。

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