公开(公告)号：US20250013526A1

公开(公告)日：2025-01-09

申请号：US18894454

申请日：2024-09-24

Applicant: xFusion Digital Technologies Co., Ltd.

Inventor： Guangbiao ZHANG ,  Quanyang BAO ,  Rui CAO ,  Weiwei WEI

IPC: G06F11/07

Abstract: A method for repairing a memory fault includes obtaining fault information of a memory, where the fault information includes a type of a fault; obtaining first repair resource information, where the first repair resource information includes a type of a first repair resource, and the first repair resource is capable of repairing the fault; determining first repair information based on the fault information and the first repair resource information, where the first repair information is used to indicate a BIOS to repair the fault by using a second repair resource, and the second repair resource is a repair resource with a smallest granularity in the first repair resource. The BIOS repairs the fault based on the first repair information.