Invention Grant
- Patent Title: Mass spectrometer and method for controlling injection of electron beam thereof
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Application No.: US15320953Application Date: 2015-12-09
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Publication No.: US10037876B2Publication Date: 2018-07-31
- Inventor: Seung Yong Kim , Mo Yang , Hyun Sik Kim
- Applicant: Korea Basic Science Institute
- Applicant Address: KR Daejeon
- Assignee: Korea Basic Science Institute
- Current Assignee: Korea Basic Science Institute
- Current Assignee Address: KR Daejeon
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2014-0194552 20141231; KR10-2015-0058163 20150424
- International Application: PCT/KR2015/013436 WO 20151209
- International Announcement: WO2016/108463 WO 20160707
- Main IPC: H01J49/00
- IPC: H01J49/00 ; H01J49/08 ; H01J49/42

Abstract:
The present invention relates to an electron bean injection control of a mass spectrometer. A mass spectrometer of the present invention includes: a reference waveform generator configured to generate a reference waveform signal having one type of a square wave and a sine wave, a waveform generator configured to generate a sync signal synchronized with the reference waveform signal; an RF module configured to generate an RF voltage signal from the reference waveform signal and apply the RF voltage signal to an RF electrode in the ion trap, an electron beam generator configured to control an operation of an ultraviolet (UV) diode for generating an electron beam injected into the ion trap according to an input control signal, and a control circuit configured to generate the control signal by using the square wave signal.
Public/Granted literature
- US20170200598A1 MASS SPECTROMETER AND METHOD FOR CONTROLLING INJECTION OF ELECTRON BEAM THEREOF Public/Granted day:2017-07-13
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