- Patent Title: Non-invasive thickness measurement using capacitance measurement
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Application No.: US15133727Application Date: 2016-04-20
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Publication No.: US10209054B2Publication Date: 2019-02-19
- Inventor: Joseph Batton Andrews , Martin Brooke , Aaron D. Franklin
- Applicant: Duke University
- Applicant Address: US NC Durham
- Assignee: DUKE UNIVERSITY
- Current Assignee: DUKE UNIVERSITY
- Current Assignee Address: US NC Durham
- Agency: Coats & Bennett, PLLC
- Main IPC: G01R27/04
- IPC: G01R27/04 ; G01R27/08 ; G01R27/26 ; G01B7/06 ; G01M17/02 ; G01B15/02 ; G06F15/00 ; G01N27/02 ; G01N27/22 ; G01N21/00

Abstract:
Methods of measuring thickness of a material using cross-capacitance. The method generally includes applying a time-varying signal to a first pad and monitoring a response of a capacitor formed by the first pad, a spaced apart second pad, and the material. The pads may be permanently affixed to the material, in spaced relation to each other. Based on the response, a capacitance of the capacitor is determined. The material may be homogenous or heterogeneous, and has dielectric properties. Because the material acts as a dielectric, the capacitance of the capacitor changes as the thickness of the material changes. Thus, the thickness of the material may be determined based on the determined capacitance. The method may be advantageously employed to measure the thickness of a vehicle tire or other material. Related apparatuses are also disclosed.
Public/Granted literature
- US20170307349A1 Non-Invasive Thickness Measurement Using Capacitance Measurement Public/Granted day:2017-10-26
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