Invention Grant
- Patent Title: Methods for etching a workpiece, an apparatus configured to etch a workpiece, and a non-transitory computer readable medium
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Application No.: US14735209Application Date: 2015-06-10
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Publication No.: US10246782B2Publication Date: 2019-04-02
- Inventor: Karl Pilch , Sonja Muringer
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: INFINEON TECHNOLOGIES AG
- Current Assignee: INFINEON TECHNOLOGIES AG
- Current Assignee Address: DE Neubiberg
- Agency: Viering, Jentschura & Partner mbb
- Main IPC: C23F1/08
- IPC: C23F1/08 ; B05C11/00 ; C23F1/14 ; B05C5/00 ; B05D1/00 ; H01L21/67 ; H01L21/306 ; H01L31/00 ; H01L21/66

Abstract:
A method for etching a workpiece may be provided, which may include: determining a plurality of reference etch profiles for a plurality of positions of an etchant dispenser, each reference etch profile corresponding to a respective position of the plurality of positions of the etchant dispenser; determining a thickness profile of the workpiece; determining a respective etch duration for each position of the plurality of positions of the etchant dispenser based on the determined thickness profile and the plurality of reference etch profiles, to reduce a total thickness variation of the workpiece; and dispensing an etchant over the workpiece via the etchant dispenser for the determined respective etch duration for each position of the plurality of positions.
Public/Granted literature
Information query
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