Invention Grant
- Patent Title: Raman spectroscopy system
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Application No.: US15578757Application Date: 2016-06-01
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Publication No.: US10295408B2Publication Date: 2019-05-21
- Inventor: Katja Szybek , Jan Sonnvik
- Applicant: SERSTECH AB
- Applicant Address: SE Lund
- Assignee: SERSTECH AB
- Current Assignee: SERSTECH AB
- Current Assignee Address: SE Lund
- Agency: Renner, Otto, Boisselle & Sklar, LLP
- Priority: SE1550706 20150601
- International Application: PCT/EP2016/062398 WO 20160601
- International Announcement: WO2016/193315 WO 20161208
- Main IPC: G01J3/44
- IPC: G01J3/44 ; G01J3/02 ; G01J1/02

Abstract:
A spectroscopy system (10) for analyzing in-elastic scattered electromagnetic radiation from an object being irradiated by electromagnetic radiation is provided. The system comprises a tunable lens assembly (13) having a tunable lens provided in the beam path between an electromagnetic radiation source (11) and the object (0) and arranged to project a beam of electromagnetic radiation emitted from the electromagnetic radiation source onto an area of the object and receive and collimate the in-elastic scattered electromagnetic radiation from the object. Based on electromagnetic radiation detected by at least a first detector (121) a control unit (14) is capable making a decision to change the operational settings of the tunable lens.
Public/Granted literature
- US20180299328A1 IMPROVED RAMAN SPECTROSCOPY SYSTEM Public/Granted day:2018-10-18
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