公开(公告)号：US10295408B2

公开(公告)日：2019-05-21

申请号：US15578757

申请日：2016-06-01

Applicant: SERSTECH AB

Inventor： Katja Szybek ,  Jan Sonnvik

IPC: G01J3/44 ,  G01J3/02 ,  G01J1/02

Abstract: A spectroscopy system (10) for analyzing in-elastic scattered electromagnetic radiation from an object being irradiated by electromagnetic radiation is provided. The system comprises a tunable lens assembly (13) having a tunable lens provided in the beam path between an electromagnetic radiation source (11) and the object (0) and arranged to project a beam of electromagnetic radiation emitted from the electromagnetic radiation source onto an area of the object and receive and collimate the in-elastic scattered electromagnetic radiation from the object. Based on electromagnetic radiation detected by at least a first detector (121) a control unit (14) is capable making a decision to change the operational settings of the tunable lens.