Invention Grant
- Patent Title: Method of reducing coma and chromatic aberration in a charged particle beam device, and charged particle beam device
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Application No.: US14798893Application Date: 2015-07-14
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Publication No.: US10297418B2Publication Date: 2019-05-21
- Inventor: Jürgen Frosien
- Applicant: ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Applicant Address: DE Heimstetten
- Assignee: ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Current Assignee: ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Current Assignee Address: DE Heimstetten
- Agency: Kilpatrick Townsend & Stockton LLP
- Main IPC: H01J37/26
- IPC: H01J37/26 ; H01J37/145 ; H01J37/153 ; H01J37/21 ; H01J37/147

Abstract:
The present disclosure provides a method of reducing coma and chromatic aberration in a charged particle beam device for providing a beam tilt of a charged particle beam. The method includes tilting the charged particle beam with a deflection assembly consisting of two or more electrostatic deflection elements, wherein at least one deflection element of the two or more deflection elements is a post-lens deflector, while the charged particle beam is guided through an essentially coma-free z-position of an objective lens, and reducing off-axis chromatic aberrations with a magnetic deflection element, wherein tilting the charged particle beam reduces coma independent of off-axis chromatic aberrations.
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