Invention Grant
- Patent Title: Measurement system, measurement management apparatus, measurement device, and measurement method
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Application No.: US14626962Application Date: 2015-02-20
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Publication No.: US10359766B2Publication Date: 2019-07-23
- Inventor: Hiroki Yoshino , Masato Yamaji , Naoyuki Fujimoto
- Applicant: YOKOGAWA ELECTRIC CORPORATION
- Applicant Address: JP Tokyo
- Assignee: Yokogawa Electric Corporation
- Current Assignee: Yokogawa Electric Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2014-037157 20140227
- Main IPC: G05B19/418
- IPC: G05B19/418 ; G05B19/042 ; G01D21/00

Abstract:
A measurement system according to one aspect of the present invention includes a plurality of measurement devices configured to perform measurements at a plurality of sites in a measurement target, respectively, and a measurement management apparatus configured to acquire measured data measured by each of the measurement devices via a communication network. Times timed by the measurement devices are correlated with each other. Each of the measurement devices is configured to transmit the measured data measured based on the correlated time to measurement management apparatus. The measurement management apparatus includes a measured data acquirer configured to acquire the measured data from each of the measurement devices.
Public/Granted literature
- US20150241871A1 MEASUREMENT SYSTEM, MEASUREMENT MANAGEMENT APPARATUS, MEASUREMENT DEVICE, AND MEASUREMENT METHOD Public/Granted day:2015-08-27
Information query
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