Invention Grant
- Patent Title: System for aligning target sensor and weapon
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Application No.: US15292068Application Date: 2016-10-12
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Publication No.: US10365067B2Publication Date: 2019-07-30
- Inventor: Sean D. Keller , Michael S. Cherry
- Applicant: RAYTHEON COMPANY
- Applicant Address: US MA Waltham
- Assignee: RAYTHEON COMPANY
- Current Assignee: RAYTHEON COMPANY
- Current Assignee Address: US MA Waltham
- Agency: Lewis Roca Rothgerber Christie LLP
- Main IPC: F41G3/06
- IPC: F41G3/06 ; F41G3/08 ; F41G3/16 ; F41G3/18 ; G01S17/02 ; F41G3/02 ; F41G3/04 ; F41G3/14 ; F41G3/32 ; F41G5/20 ; F41G5/26 ; G01S17/66

Abstract:
A system for aligning a weapon to a high-performance target sensor. A reference measurement sensor installed on the target sensor measures the direction and range to each of several references points on the weapon. From these measurements, and measurement by the target sensor of target states, a processing circuit calculates the states of the target in a coordinate system of the weapon. Each reference point may be a retroreflector; the reference measurement sensor may include an imaging sensor to measure direction, and a laser range finder to measure range.
Public/Granted literature
- US20180216915A1 SYSTEM FOR ALIGNING TARGET SENSOR AND WEAPON Public/Granted day:2018-08-02
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