Invention Grant
- Patent Title: Method and apparatus for measuring inelastic scattering
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Application No.: US15410867Application Date: 2017-01-20
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Publication No.: US10371641B2Publication Date: 2019-08-06
- Inventor: Juha Kostamovaara , Ilkka Nissinen , Jan Nissinen , Rami Aikio , Jussi Tenhunen , Lauri Kurki
- Applicant: TimeGate Instruments Oy
- Applicant Address: FI Oulu
- Assignee: TimeGate Instruments Oy
- Current Assignee: TimeGate Instruments Oy
- Current Assignee Address: FI Oulu
- Agency: Ziegler IP Law Group, LLC
- Priority: FI20165037 20160121
- Main IPC: G01J3/44
- IPC: G01J3/44 ; G01N21/65 ; G01J1/44

Abstract:
An apparatus, includes an illuminating light source and illuminating optics arranged to illuminate a sample region with illuminating light pulses, light gathering optics to gather Raman scattered light pulses from the sample region, a spectral disperser and a detector array for measuring the spectral intensity distribution of Raman scattered light pulses obtained from the sample region and an auxiliary detector for providing an indicator signal indicative of elastic scattering coefficient of the sample region. The apparatus is arranged to form a first output spectrum from the spectral intensity distribution of a first group of Raman scattered light pulses. The pulses of the first group of Raman scattered light pulses are obtained from the sample region when the indicator signal indicates that an object is located in the sample region.
Public/Granted literature
- US20170234797A1 METHOD AND APPARATUS FOR MEASURING INELASTIC SCATTERING Public/Granted day:2017-08-17
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