Invention Grant
- Patent Title: Substrate processing apparatus, substrate processing method, and recording medium
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Application No.: US15801803Application Date: 2017-11-02
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Publication No.: US10395950B2Publication Date: 2019-08-27
- Inventor: Gentaro Goshi , Keisuke Egashira , Yosuke Kawabuchi , Hiromi Kiyose , Takuro Masuzumi , Hiroki Ohno , Kento Tsukano , Hiroshi Marumoto , Shotaro Kitayama
- Applicant: Tokyo Electron Limited
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Abelman Frayne & Schwab
- Priority: JP2016-216313 20161104
- Main IPC: B01J3/00
- IPC: B01J3/00 ; B01J3/06 ; B08B7/00 ; H01L21/02 ; H01L21/67

Abstract:
A substrate processing apparatus performs: a pressure raising process of raising a pressure within the processing container to a processing pressure higher than a critical pressure of the processing fluid, after the substrate is accommodated in the processing container; and a circulation process of supplying the processing fluid to the processing container and discharging the processing fluid from the processing container while keeping a pressure at which the processing fluid is maintained in the supercritical state, within the processing container. In the pressure raising process, the supply of the processing fluid from the second fluid supply unit is stopped and the processing fluid is supplied from the first fluid supply unit into the processing container until at least the pressure within the processing container reaches the critical pressure. In the circulation process, the processing fluid is supplied into the processing container from the second fluid supply unit.
Public/Granted literature
- US20180130675A1 SUBSTRATE PROCESSING APPARATUS, SUBSTRATE PROCESSING METHOD, AND RECORDING MEDIUM Public/Granted day:2018-05-10
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