Invention Grant
- Patent Title: Sparse sampling methods and probe systems for analytical instruments
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Application No.: US15643862Application Date: 2017-07-07
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Publication No.: US10431419B2Publication Date: 2019-10-01
- Inventor: Libor Kovarik , Andrew J. Stevens , Andrey V. Liyu , Nigel D. Browning
- Applicant: BATTELLE MEMORIAL INSTITUTE
- Applicant Address: US WA Richland
- Assignee: Battelle Memorial Institute
- Current Assignee: Battelle Memorial Institute
- Current Assignee Address: US WA Richland
- Agency: Klarquist Sparkman, LLP
- Main IPC: H01J37/26
- IPC: H01J37/26 ; G01Q10/00 ; H01J37/22 ; H01J37/28

Abstract:
Sparse sampling approaches and probe systems for analytical instruments are disclosed providing for effective sub-sampling of a specimen and inpainting to reconstruct representations of actual information. The sub-sampling involves serial acquisition of contiguous measured values lying at positions along a scan path extending in a line toward a first direction and having random perturbations in a second direction. The perturbations are limited within a predetermined distance from the line. Inpainting techniques are utilized among the measured values to reconstruct a representation of actual information regarding the specimen.
Public/Granted literature
- US20180025887A1 SPARSE SAMPLING METHODS AND PROBE SYSTEMS FOR ANALYTICAL INSTRUMENTS Public/Granted day:2018-01-25
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