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    Techniques for controlling distance between a sample and sample probe while such probe liberates analyte from a sample region for analysis with a mass spectrometer
    2.
    发明授权
    Techniques for controlling distance between a sample and sample probe while such probe liberates analyte from a sample region for analysis with a mass spectrometer 有权

    公开(公告)号：US10134572B2

    公开(公告)日：2018-11-20

    申请号：US15225585

    申请日：2016-08-01

    Applicant: BATTELLE MEMORIAL INSTITUTE

    Inventor： Julia Laskin ,  Son N. Nguyen ,  Andrey V. Liyu

    IPC: H01J49/00 ,  H01J49/04

    Abstract: A system includes a mass spectrometer and associated sample interfacing equipment. The sample interfacing equipment includes a platform structured to support a sample thereon, a fluid source, a high voltage source, a dispensing probe electrically coupled to the high voltage source and defining a fluid dispensing passage therethrough, a collection probe defining a collection passage therethrough, a sensing arrangement coupled to the dispensing probe, and control logic responsive to the sensing arrangement to control distance between the dispensing probe and the sample. The dispensing probe facilitates formation of one or more ionized sample analytes when dispensing the fluid through the dispensing passage proximate to the sample on the platform. The collecting probe receives at least some of the one or more ionized sample analytes to pass through the collection passage into the mass spectrometer for analysis.

    Electron beam masks for compressive sensors
    3.
    发明授权
    Electron beam masks for compressive sensors 有权

    公开(公告)号：US10109453B2

    公开(公告)日：2018-10-23

    申请号：US15075031

    申请日：2016-03-18

    Applicant: Battelle Memorial Institute

    Inventor： Andrew J. Stevens ,  Libor Kovarik ,  Nigel D. Browning ,  Andrey V. Liyu

    IPC: H01J37/22 ,  G03F7/20 ,  G03F7/30 ,  H01J37/244 ,  H01J37/26

    Abstract: Transmission microscopy imaging systems include a mask and/or other modulator situated to encode image beams, e.g., by deflecting the image beam with respect to the mask and/or sensor. The beam is modulated/masked either before or after transmission through a sample to induce a spatially and/or temporally encoded signal by modifying any of the beam/image components including the phase/coherence, intensity, or position of the beam at the sensor. For example, a mask can be placed/translated through the beam so that several masked beams are received by a sensor during a single sensor integration time. Images associated with multiple mask displacements are then used to reconstruct a video sequence using a compressive sensing method. Another example of masked modulation involves a mechanism for phase-retrieval, whereby the beam is modulated by a set of different masks in the image plane and each masked image is recorded in the diffraction plane.

    Systems and Methods to Control Sources of Atomic Species in a Deposition Process
    4.
    发明申请
    Systems and Methods to Control Sources of Atomic Species in a Deposition Process 审中-公开
    控制沉积过程中原子物质来源的系统和方法

    公开(公告)号：US20150284851A1

    公开(公告)日：2015-10-08

    申请号：US14246477

    申请日：2014-04-07

    Applicant: BATTELLE MEMORIAL INSTITUTE

    Inventor： Yingge Du ,  Scott A. Chambers ,  Timothy C. Droubay ,  Andrey V. Liyu

    IPC: C23C16/52

    CPC classification number: C23C14/544 ,  G01N21/3103

    Abstract: Systems and methods as well as components and techniques can exhibit stable and accurate control of a deposition process by monitoring background-corrected deposition rates of an atomic species via atomic absorption (AA) spectroscopy. The systems and methods have high sensitivity and resolution in addition to extremely effective background correction and baseline drift removal, achieved in part by basing the background correction and baseline drift removal on analysis of resonant and non-resonant AA lines. The systems and methods can result in surprisingly short warm-up times and can drastically reduce the noise coming from the instruments and the surrounding environment.

    Abstract translation: 系统和方法以及组件和技术可以通过通过原子吸收（AA）光谱监测原子物质的背景校正的沉积速率来显示沉积过程的稳定和准确的控制。 除了非常有效的背景校正和基线漂移去除之外，系统和方法具有高灵敏度和分辨率，部分通过基于谐振和非共振AA线分析的背景校正和基线漂移去除实现。 这些系统和方法可以令人惊讶的短暂的预热时间，并可以大大减少来自仪器和周围环境的噪音。

    ELECTRON BEAM MASKS FOR COMPRESSIVE SENSORS
    5.
    发明申请
    ELECTRON BEAM MASKS FOR COMPRESSIVE SENSORS 审中-公开
    用于压缩传感器的电子束屏蔽

    公开(公告)号：US20160276050A1

    公开(公告)日：2016-09-22

    申请号：US15075031

    申请日：2016-03-18

    Applicant: Battelle Memorial Institute

    Inventor： Andrew J. Stevens ,  Libor Kovarik ,  Nigel D. Browning ,  Andrey V. Liyu

    IPC: G21K1/02 ,  G03F7/30 ,  G03F7/20

    CPC classification number: H01J37/222 ,  G03F7/20 ,  G03F7/30 ,  H01J37/244 ,  H01J37/26 ,  H01J2237/0451 ,  H01J2237/0453 ,  H01J2237/226 ,  H01J2237/24455 ,  H01J2237/2802

    Abstract: Transmission microscopy imaging systems include a mask and/or other modulator situated to encode image beams, e.g., by deflecting the image beam with respect to the mask and/or sensor. The beam is modulated/masked either before or after transmission through a sample to induce a spatially and/or temporally encoded signal by modifying any of the beam/image components including the phase/coherence, intensity, or position of the beam at the sensor. For example, a mask can be placed/translated through the beam so that several masked beams are received by a sensor during a single sensor integration time. Images associated with multiple mask displacements are then used to reconstruct a video sequence using a compressive sensing method. Another example of masked modulation involves a mechanism for phase-retrieval, whereby the beam is modulated by a set of different masks in the image plane and each masked image is recorded in the diffraction plane.

    Abstract translation: 透射显微镜成像系统包括掩模和/或其它调制器，其位于编码图像束，例如通过相对于掩模和/或传感器偏转图像束。 在通过样本传输之前或之后，波束被调制/屏蔽，以通过修改包括传感器上的波束的相位/相干性，强度或位置的任何波束/图像分量来诱导空间和/或时间编码的信号。 例如，可以通过光束放置/平移掩模，使得在单个传感器积分时间期间，传感器接收多个屏蔽光束。 然后使用与多个掩模位移相关联的图像来使用压缩感测方法重建视频序列。 掩模调制的另一示例涉及相位检索的机制，由此通过图像平面中的一组不同的掩模来调制光束，并且每个被掩蔽的图像被记录在衍射平面中。

    Compressive transmission microscopy
    8.
    发明授权
    Compressive transmission microscopy 有权

    公开(公告)号：US10224175B2

    公开(公告)日：2019-03-05

    申请号：US15075015

    申请日：2016-03-18

    Applicant: Battelle Memorial Institute

    Inventor： Andrew J. Stevens ,  Libor Kovarik ,  Nigel D. Browning ,  Andrey V. Liyu ,  Xin Yuan ,  Lawrence Carin

    IPC: H01J37/22 ,  G03F7/20 ,  G03F7/30 ,  H01J37/244 ,  H01J37/26

    Abstract: Transmission microscopy imaging systems include a mask and/or other modulator situated to encode image beams, e.g., by deflecting the image beam with respect to the mask and/or sensor. The beam is modulated/masked either before or after transmission through a sample to induce a spatially and/or temporally encoded signal by modifying any of the beam/image components including the phase/coherence, intensity, or position of the beam at the sensor. For example, a mask can be placed/translated through the beam so that several masked beams are received by a sensor during a single sensor integration time. Images associated with multiple mask displacements are then used to reconstruct a video sequence using a compressive sensing method. Another example of masked modulation involves a mechanism for phase-retrieval, whereby the beam is modulated by a set of different masks in the image plane and each masked image is recorded in the diffraction plane.

    SPARSE SAMPLING METHODS AND PROBE SYSTEMS FOR ANALYTICAL INSTRUMENTS
    9.
    发明申请
    SPARSE SAMPLING METHODS AND PROBE SYSTEMS FOR ANALYTICAL INSTRUMENTS 审中-公开

    公开(公告)号：US20180025887A1

    公开(公告)日：2018-01-25

    申请号：US15643862

    申请日：2017-07-07

    Applicant: BATTELLE MEMORIAL INSTITUTE

    Inventor： Libor Kovarik ,  Andrew J. Stevens ,  Andrey V. Liyu ,  Nigel D. Browning

    IPC: H01J37/22 ,  H01J37/28

    Abstract: Sparse sampling approaches and probe systems for analytical instruments are disclosed providing for effective sub-sampling of a specimen and inpainting to reconstruct representations of actual information. The sub-sampling involves serial acquisition of contiguous measured values lying at positions along a scan path extending in a line toward a first direction and having random perturbations in a second direction. The perturbations are limited within a predetermined distance from the line. Inpainting techniques are utilized among the measured values to reconstruct a representation of actual information regarding the specimen.

    COMPRESSIVE TRANSMISSION MICROSCOPY
    10.
    发明申请
    COMPRESSIVE TRANSMISSION MICROSCOPY 审中-公开
    压缩传输显微镜

    公开(公告)号：US20160276129A1

    公开(公告)日：2016-09-22

    申请号：US15075015

    申请日：2016-03-18

    Applicant: Battelle Memorial Institute

    Inventor： Andrew J. Stevens ,  Libor Kovarik ,  Nigel D. Browning ,  Andrey V. Liyu ,  Xin Yuan ,  Lawrence Carin

    IPC: H01J37/22 ,  H01J37/244 ,  H01J37/26

    CPC classification number: H01J37/222 ,  G03F7/20 ,  G03F7/30 ,  H01J37/244 ,  H01J37/26 ,  H01J2237/0451 ,  H01J2237/0453 ,  H01J2237/226 ,  H01J2237/24455 ,  H01J2237/2802

    Abstract: Transmission microscopy imaging systems include a mask and/or other modulator situated to encode image beams, e.g., by deflecting the image beam with respect to the mask and/or sensor. The beam is modulated/masked either before or after transmission through a sample to induce a spatially and/or temporally encoded signal by modifying any of the beam/image components including the phase/coherence, intensity, or position of the beam at the sensor. For example, a mask can be placed/translated through the beam so that several masked beams are received by a sensor during a single sensor integration time. Images associated with multiple mask displacements are then used to reconstruct a video sequence using a compressive sensing method. Another example of masked modulation involves a mechanism for phase-retrieval, whereby the beam is modulated by a set of different masks in the image plane and each masked image is recorded in the diffraction plane.

    Abstract translation: 透射显微镜成像系统包括掩模和/或其它调制器，其位于编码图像束，例如通过相对于掩模和/或传感器偏转图像束。 在通过样本传输之前或之后，波束被调制/屏蔽，以通过修改包括传感器上的波束的相位/相干性，强度或位置的任何波束/图像分量来诱导空间和/或时间编码的信号。 例如，可以通过光束放置/平移掩模，使得在单个传感器积分时间期间，传感器接收多个屏蔽光束。 然后使用与多个掩模位移相关联的图像来使用压缩感测方法重建视频序列。 掩模调制的另一示例涉及相位检索的机制，由此通过图像平面中的一组不同的掩模来调制光束，并且每个被掩蔽的图像被记录在衍射平面中。

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