- Patent Title: Metal core solder ball interconnector fan-out wafer level package
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Application No.: US15780189Application Date: 2016-11-28
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Publication No.: US10679930B2Publication Date: 2020-06-09
- Inventor: Hyun Woo Lee , Jin Wook Jeong , Hyun Joo Kim , Jin Young Ock
- Applicant: HANA MICRON INC.
- Applicant Address: KR Chungcheongnam-do
- Assignee: HANA MICRON INC.
- Current Assignee: HANA MICRON INC.
- Current Assignee Address: KR Chungcheongnam-do
- Agency: Norton Rose Fulbright US LLP
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@119304f4 com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@18aefef8
- International Application: PCT/KR2016/013781 WO 20161128
- International Announcement: WO2017/095094 WO 20170608
- Main IPC: H01L23/49
- IPC: H01L23/49 ; H01L23/00 ; H01L23/28 ; H01L23/31 ; H01L23/48 ; H01L23/538 ; H01L25/07 ; H01L25/10 ; H01L23/498 ; H01L21/683 ; H01L25/065 ; H01L25/00 ; H01L23/488 ; H01L21/48 ; H01L21/56

Abstract:
A fan-out wafer level package is disclosed, which includes: a redistribution layer; a semiconductor chip electrically connected with the redistribution layer through a bump; a protective member protecting the semiconductor chip, wherein a part of the protective member is removed such that the upper surface of the semiconductor chip is exposed in order to dissipate heat and prevent warpage; and an interconnector disposed outside the semiconductor chip at substantially the same level and having a lower part electrically connected with the redistribution layer and an upper part not being covered with the protective member, wherein the interconnector includes a metal core solder ball, the metal core solder ball includes a metal core and a solder buffer between the metal core and the protective member, and the metal core is formed of a combination of copper (Cu), nickel (Ni), and silver (Ag).
Public/Granted literature
- US20180358288A1 METAL CORE SOLDER BALL INTERCONNECTOR FAN-OUT WAFER LEVEL PACKAGE AND MANUFACTURING METHOD THEREFOR Public/Granted day:2018-12-13
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