Invention Grant
- Patent Title: Systems and methods for calibration, verification, and sensitivity checks for detectors
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Application No.: US15388589Application Date: 2016-12-22
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Publication No.: US10707063B2Publication Date: 2020-07-07
- Inventor: Hartwig Schmidt , Michael E. Patterson , Stefan R. Lukow , Kenneth R. Gonthier , Hanh T. Lai , Vibha Mishra
- Applicant: Rapiscan Systems, Inc.
- Applicant Address: US CA Torrance
- Assignee: Rapiscan Systems, Inc.
- Current Assignee: Rapiscan Systems, Inc.
- Current Assignee Address: US CA Torrance
- Agency: Novel IP
- Main IPC: H01J49/14
- IPC: H01J49/14 ; H01J49/00 ; G01N27/62 ; H01J49/02

Abstract:
The present disclosure is directed to methods and systems for calibration, calibration verification, and sensitivity checks for a detector. The methods and systems include calibrating a detector by releasing at least one calibrant from at least one calibrant chamber in flow communication with the detector. The systems and methods further include verifying the calibration by releasing at least one verification substance from at least one verification chamber in flow communication with the detector. The systems and methods further include checking a sensitivity of the detector by releasing at least one sensitivity substance from at least one sensitivity chamber in flow communication with the detector.
Public/Granted literature
- US20180182603A1 SYSTEMS AND METHODS FOR CALIBRATION, VERIFICATION, AND SENSITIVITY CHECKS FOR DETECTORS Public/Granted day:2018-06-28
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