- Patent Title: Selectively regrown top contact for vertical semiconductor devices
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Application No.: US15119674Application Date: 2014-03-28
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Publication No.: US10727339B2Publication Date: 2020-07-28
- Inventor: Benjamin Chu-Kung , Gilbert Dewey , Van H. Le , Jack T. Kavalieros , Marko Radosavljevic , Ravi Pillarisetty , Han Wui Then , Niloy Mukherjee , Sansaptak Dasgupta
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Schwabe, Williamson & Wyatt, P.C.
- International Application: PCT/US2014/032204 WO 20140328
- International Announcement: WO2015/147866 WO 20151001
- Main IPC: H01L29/06
- IPC: H01L29/06 ; H01L29/417 ; H01L29/423 ; H01L29/78 ; H01L29/786 ; H01L21/336 ; H01L29/66 ; H01L29/08 ; H01L29/739

Abstract:
Vertical semiconductor devices having selectively regrown top contacts and method of fabricating vertical semiconductor devices having selectively regrown top contacts are described. For example, a semiconductor device includes a substrate having a surface. A first source/drain region is disposed on the surface of the substrate. A vertical channel region is disposed on the first source/drain region and has a first width parallel with the surface of the substrate. A second source/drain region is disposed on the vertical channel region and has a second width parallel with and substantially greater than the first width. A gate stack is disposed on and completely surrounds a portion of the vertical channel region.
Public/Granted literature
- US20170012126A1 SELECTIVELY REGROWN TOP CONTACT FOR VERTICAL SEMICONDUCTOR DEVICES Public/Granted day:2017-01-12
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