Invention Grant
- Patent Title: Multi-reflecting TOF mass spectrometer
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Application No.: US15570537Application Date: 2016-04-29
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Publication No.: US10741376B2Publication Date: 2020-08-11
- Inventor: John Brian Hoyes , Keith Richardson , Anatoly Verenchikov , Mikhail Yavor
- Applicant: Micromass UK Limited , LECO Corporation
- Applicant Address: GB Wilmslow
- Assignee: MICROMASS UK LIMITED
- Current Assignee: MICROMASS UK LIMITED
- Current Assignee Address: GB Wilmslow
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@560c0341
- International Application: PCT/GB2016/051238 WO 20160429
- International Announcement: WO2016/174462 WO 20161103
- Main IPC: H01J49/40
- IPC: H01J49/40 ; H01J49/42 ; H01J49/00 ; H01J49/06

Abstract:
A method of time-of-flight mass spectrometry is disclosed comprising: providing two ion mirrors (42) that are spaced apart in a first dimension (X-dimension) and that are each elongated in a second dimension (Z-dimension) orthogonal to the first dimension; introducing packets of ions (47) into the space between the mirrors using an ion introduction mechanism (43) such that the ions repeatedly oscillate in the first dimension (X-dimension) between the mirrors (42) as they drift through said space in the second dimension (Z-dimension); oscillating the ions in a third dimension (Y-dimension) orthogonal to both the first and second dimensions as the ions drift through said space in the second dimension (Z-dimension); and receiving the ions in or on an ion receiving mechanism (44) after the ions have oscillated multiple times in the first dimension (X-dimension); wherein at least part of the ion introduction mechanism (43) and/or at least part of the ion receiving mechanism (44) is arranged between the mirrors (42).
Public/Granted literature
- US20180144921A1 MULTI-REFLECTING TOF MASS SPECTROMETER Public/Granted day:2018-05-24
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