Invention Grant
- Patent Title: Techniques for mass analyzing a complex sample based on nominal mass and mass defect information
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Application No.: US15819793Application Date: 2017-11-21
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Publication No.: US10825672B2Publication Date: 2020-11-03
- Inventor: Scott J. Geromanos , Curt Devlin , Steven J. Ciavarini
- Applicant: WATERS TECHNOLOGIES CORPORATION
- Applicant Address: US MA Milford
- Assignee: WATERS TECHNOLOGIES CORPORATION
- Current Assignee: WATERS TECHNOLOGIES CORPORATION
- Current Assignee Address: US MA Milford
- Main IPC: H01J49/00
- IPC: H01J49/00 ; G16B40/00 ; G16B20/00

Abstract:
Techniques and apparatus for analyzing mass spectrometry data are described. In one embodiment, for example, an apparatus may include logic to access a product ion data set generated via mass analyzing a sample comprising a target precursor, access precursor composition information for elements of the target precursor that includes nominal mass and mass defect information, determine nominal mass (NM)-mass defect (MD) relationship information for ion fragments associated with the target precursor based on the precursor composition information, determine one or more fragment upper boundaries and one or more fragment lower boundaries, extract candidate ion fragments from the ion fragments via applying the one or more fragment upper boundaries and the one or more fragment lower boundaries to the NM-MD relationship information, and determine target ion fragments from the plurality of candidate ion fragments based on fragmentation efficiency information associated with the candidate ion fragments. Other embodiments are described and claimed.
Public/Granted literature
- US20180144918A1 TECHNIQUES FOR MASS ANALYZING A COMPLEX SAMPLE Public/Granted day:2018-05-24
Information query