Invention Grant
- Patent Title: Ion beam focus adjustment
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Application No.: US16257135Application Date: 2019-01-25
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Publication No.: US10916414B2Publication Date: 2021-02-09
- Inventor: Harris Fienberg , David Stumbo , Michael Angelo , Rachel Finck
- Applicant: IONpath, Inc.
- Applicant Address: US CA Menlo Park
- Assignee: IONpath, Inc.
- Current Assignee: IONpath, Inc.
- Current Assignee Address: US CA Menlo Park
- Agency: Fish & Richardson P.C.
- Main IPC: H01J49/00
- IPC: H01J49/00 ; G01N33/68 ; H01J49/06 ; G01N33/58

Abstract:
The disclosure features systems and methods that include: exposing a biological sample to an ion beam that is incident on the sample at a first angle to a plane of the sample by translating a position of the ion beam on the sample in a first direction relative to a projection of a direction of incidence of the ion beam on the sample; after each translation of the ion beam in the first direction, adjusting a focal length of an ion source that generates the ion beam; and measuring and analyzing secondary ions generated from the sample by the ion beam after adjustment of the focal length to determine mass spectral information for the sample, where the sample is labeled with one or more mass tags and the mass spectral information includes populations of the mass tags at locations of the sample.
Public/Granted literature
- US20190228958A1 ION BEAM FOCUS ADJUSTMENT Public/Granted day:2019-07-25
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