Invention Grant
- Patent Title: Primary beam scanning apparatus and signal processing method
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Application No.: US16561443Application Date: 2019-09-05
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Publication No.: US10923316B2Publication Date: 2021-02-16
- Inventor: Takanori Matsubara
- Applicant: JEOL Ltd.
- Applicant Address: JP Tokyo
- Assignee: JEOL Ltd.
- Current Assignee: JEOL Ltd.
- Current Assignee Address: JP Tokyo
- Agency: The Webb Law Firm
- Priority: JPJP2018-174946 20180919
- Main IPC: H01J37/26
- IPC: H01J37/26 ; H01J37/28

Abstract:
There is provided a primary beam scanning apparatus capable of producing data having a bit depth higher than the resolution of an analog-to-digital converter. The primary beam scanning apparatus is capable of controlling a scan rate of a primary beam for scanning a specimen. The scanning apparatus includes a detector for detecting signals generated in response to irradiation of the specimen with the primary beam and providing an analog output signal, an analog-to-digital converter for sampling the analog signal and converting it into a digital signal, and an arithmetic section for averaging the digital signal.
Public/Granted literature
- US20200090902A1 Primary Beam Scanning Apparatus and Signal Processing Method Public/Granted day:2020-03-19
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