Invention Grant
- Patent Title: Apparatus and method for measuring a three dimensional shape
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Application No.: US16735186Application Date: 2020-01-06
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Publication No.: US10996050B2Publication Date: 2021-05-04
- Inventor: Seung-Jun Lee , Kwangill Koh , Moon-Young Jeon , Sang-Kyu Yun , Hong-Min Kim , Jung Hur
- Applicant: KOH YOUNG TECHNOLOGY INC.
- Applicant Address: KR Seoul
- Assignee: KOH YOUNG TECHNOLOGY INC.
- Current Assignee: KOH YOUNG TECHNOLOGY INC.
- Current Assignee Address: KR Seoul
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: KR10-2008-0017439 20080226,KR10-2008-0082629 20080823,KR10-2009-0015691 20090225
- Main IPC: G01B11/25
- IPC: G01B11/25 ; G01B11/245 ; H04N5/247 ; G02B27/40

Abstract:
Provided are an apparatus and a method for measuring a three dimensional shape with improved accuracy. The apparatus includes a stage, at least one lighting unit, a plurality of image pickup units and a control unit. The stage supports an object to be measured. The lighting unit includes a light source and a grid, and radiates grid-patterned light to the object to be measured. The image pickup units capture, in different directions, grid images reflected from the object to be measured. The control unit calculates a three dimensional shape of the object from the grid images captured by the image pickup units. The present invention has advantages in capturing grid images through a main image pickup portion and sub-image pickup portions, enabling the measurement of the three dimensional shape of the object in a rapid and accurate manner.
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